Adjustable update rate for measuring probe
AssigneeMitutoyo Corporation
InventorsScott Allen Harsila, Bjorn Erik Bertil Jansson, Hiroyuki Kanamori
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AssigneeMitutoyo Corporation
InventorsScott Allen Harsila, Bjorn Erik Bertil Jansson, Hiroyuki Kanamori
Estimating the term…
A measuring system includes a measuring probe with a contact portion that contacts a workpiece to be measured. The measuring probe operates with a first update rate during at least part of a moving mode, wherein the moving mode includes movement of the measuring probe such that the contact portion is moved away from the workpiece and/or is moved at a distance from the workpiece that is equal to or greater than a threshold distance. The measuring probe operates with a second update rate (i.e., which is faster than the first update rate) during at least part of a measuring mode, wherein the measuring mode includes movement of the measuring probe such that the contact portion is moved toward the workpiece for obtaining a measurement. In various implementations, the combined use of the first and second update rates effectively reduces power-on drift of the measuring probe.
A measuring system, comprising:
A method for operating a measuring system including a measuring probe with a contact portion to be in contact with a workpiece to be measured, the method comprising:
A measuring system, comprising:
Dependencies are inferred from the claim text.