Apparatuses and methods for skipping wordline activation of defective memory during refresh operations
AssigneeMicron Technology, Inc.
InventorMinari Arai
Life of this patent
Estimating the term…
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AssigneeMicron Technology, Inc.
InventorMinari Arai
Estimating the term…
Apparatuses and methods for refreshing memory of a semiconductor device are described. An example method includes during a refresh operation, determining a respective row of a memory cells slated for refresh in each of a plurality of sections of a memory bank of a memory device, and determining whether the respective row of memory cells slated for refresh for a particular section of the plurality of sections of the memory bank has been repaired. The example method further includes in response to a determination that the row of memory cells slated for refresh has been repaired, cause a refresh within the particular section of the memory bank to be skipped while contemporaneously performing a refresh of the rows of memory cells slated for refresh in other sections of the plurality of sections of the memory bank to be refreshed.
An apparatus, comprising:
An apparatus, comprising:
A method, comprising:
A row address control circuit, comprising:
A row address control circuit, comprising:
A row address control circuit, comprising:
Dependencies are inferred from the claim text.