# US 12,183,227 B2 · Display device having a detection line and method for inspection thereof

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- Number: US 12,183,227 B2
- Document ID: US12183227B2
- Status: Granted
- Kind: B2
- Application number: 18/192,781
- Filed: 2023-03-30
- Published: 2023-07-27
- Granted: 2024-12-31
- Earliest claimed: 2018-11-02
- Assignees: Samsung Display Co., Ltd.
- Applicants: Samsung Display Co., Ltd.
- Inventors: Kwang Sae Lee; Won Kyu Kwak; Ki Myeong Eom
- Web page: https://patentgrep.com/patent/US12183227B2

## CPC

- G09G 3/006: {Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309)}
- G06F 1/1652: {the display being flexible, e.g. mimicking a sheet of paper, or rollable}
- G09G 3/3225: using an active matrix
- G09G 3/3291: in which the data driver supplies a variable data voltage for setting the current through, or the voltage across, the light-emitting elements
- G09G 3/3648: {using an active matrix (G09G3/367 - G09G3/3696 take precedence)}
- G09G 2330/12: Test circuits or failure detection circuits included in a display system, as permanent part thereof
- G09G: ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION (arrangements for transferring data between digital computers and displays G06F3/14; static indicating arrangements comprising an association of a number of separate sources or light control cells G09F9/00; static indicating arrangements comprising integral associations of a number of light sources H01J, H01K, H10H, H05B33/12; scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission, details thereof H04N1/00)
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)

## Abstract

A display device includes a display area configured to include a plurality of pixels and a plurality of data lines connected to the pixels. A hole area is disposed within the display area. A hole crack detection line is disposed adjacent to the hole area and surrounds the hole area. The device includes first and second detection lines which include first and second detection transfer lines and first and second detection receiving lines, respectively. A test controller electrically connects the first detection receiving line to a first data line and the second detection receiving line to a second data line. Pixels connected to the first data line that is connected to a first bright-line transistor and pixels connected to the second data line that is connected to a second bright-line transistor are configured to emit light when a crack occurs in the hole crack detection line.

## Claims

### Claim 1

A display device comprising:
a display area that includes a plurality of pixels and a plurality of data lines connected to the pixels;
a hole area disposed within the display area;
a detection line surrounding the hole area and having a first end and a second end that are separated from each other;
a first line electrically connected to the first end of the detection line;
a second line electrically connected to the second end of the detection line;
a third line electrically connected to the first end of the detection line;
a fourth line electrically connected to the second end of the detection line; and
a circuit configured such that the second line is electrically connected to one of the plurality of data lines and the fourth line is electrically connected to another one of the plurality of the data lines.

### Claim 2 (depends on 1)

The display device of claim 1, further comprising:
a test voltage line that includes a first end connected to the first line and a second end connected to the third line.

### Claim 3 (depends on 2)

The display device of claim 2, wherein:
the circuit includes a first test transistor and a second test transistor,
a first electrode of the first test transistor is connected to a first data line,
a second electrode of the first test transistor is connected to the second line,
a first electrode of the second test transistor is connected to a second data line, and
a second electrode of the second test transistor is connected to the fourth line.

### Claim 4 (depends on 3)

The display device of claim 3, wherein
the circuit further includes a seventh test transistor, and
a second electrode of the seventh test transistor is connected to the test voltage line.

### Claim 5 (depends on 3)

The display device of claim 3, wherein:
pixels connected to the first data line connected to the first test transistor are configured to emit light when a crack occurs in the detection line to display a first bright line, and
pixels connected to the second data line connected to the second test transistor are configured to emit light when a crack occurs in the detection line to display a second bright line.

### Claim 6 (depends on 5)

The display device of claim 5, wherein the first bright line and the second bright line are disposed at a central portion of the display area.

### Claim 7 (depends on 6)

The display device of claim 6, wherein:
the first line is connected to a first test pad to which a first test voltage is applied, and
the third line is connected to a second test pad to which a second test voltage is applied.

### Claim 8 (depends on 7)

The display device of claim 7, further comprising:
a detection control line configured to have a first end connected to a third test pad and a second end connected to a gate electrode of each of the first test transistor and the second test transistor.

### Claim 9 (depends on 8)

The display device of claim 8, further comprising:
a first detection line which includes a first end that is connected to a fourth test pad; and
wherein the circuit further includes a third test transistor,
wherein a first electrode of the third test transistor is connected to a third data line,
wherein the first detection line is configured to extend along an edge of a first side of the display area and return to connect a second electrode of the third test transistor, and
pixels connected to the third data line connected to the third test transistor are configured to emit light when a crack occurs in the first detection line to display a third bright line.

### Claim 10 (depends on 9)

The display device of claim 9, further comprising:
a second detection line configured to have a first end that is connected to a fifth test pad; and
wherein the circuit further includes a fourth test transistor,
wherein a first electrode of the fourth test transistor is connected to a fourth data line,
wherein the second detection line is configured to extend along an edge of a second side of the display area and return to connect to a second electrode of the fourth test transistor, and
pixels connected to the fourth data line connected to the fourth test transistor are configured to emit light when a crack occurs in the second detection line to display a fourth bright line.

### Claim 11 (depends on 10)

The display device of claim 10, further comprising:
a bendable area disposed around the display area;
a third detection line that includes a first end that is connected to a sixth test pad; and
wherein the circuit further includes a fifth test transistor,
wherein a first electrode of the fifth test transistor is connected to a fifth data line,
wherein the third detection line is configured to extend to the bendable area and return to connect to a second electrode of the fifth test transistor, and
pixels connected to the fifth data line connected to the fifth test transistor are configured to emit light when a crack occurs in the third detection line to display a fifth bright line.

### Claim 12 (depends on 10)

The display device of claim 10, wherein
the fifth bright line is disposed at a left part of the display area, and
the third bright line is disposed between the first bright line and the fifth bright line, in a plan view.

### Claim 13 (depends on 11)

The display device of claim 11, further comprising:
a fourth detection line that includes a first end that is connected to a seventh test pad;
wherein the circuit further includes a sixth test transistor,
wherein a first electrode of the sixth test transistor is connected to a sixth data line,
wherein the fourth detection line is configured to extend to the bendable area and return to connect to a second electrode of the sixth test transistor, and
pixels connected to the sixth data line connected to the sixth test transistor are configured to emit light when a crack occurs in the fourth detection line to display a sixth bright line.

### Claim 14 (depends on 13)

The display device of claim 13, wherein
the sixth bright line is disposed at a right part of the display area, and
the fourth bright line is disposed between the second bright line and the sixth bright line, in a plan view.

### Claim 15 (depends on 13)

The display device of claim 13, wherein:
the fourth test pad and the sixth test pad are connected to the first test pad, wherein the first test pad serves as a first common test pad, and
the fifth test pad and the seventh test pad are connected to the second test pad, wherein the second test pad serves as a second common test pad.

### Claim 16 (depends on 15)

The display device of claim 15, wherein:
the first line is configured to extend to a portion between the fourth test pad and the sixth test pad, and
the third line is configured to extend to a portion between the fifth test pad and the seventh test pad.

### Claim 17 (depends on 13)

The display device of claim 13, wherein:
the second end of the detection control line is also connected to a gate electrode of each of the third test transistor, the fourth test transistor, the fifth test transistor, and the sixth test transistor.