# US 12,182,486 B2 · System and method for modeling damages caused by incident particles

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- Number: US 12,182,486 B2
- Document ID: US12182486B2
- Status: Granted
- Kind: B2
- Application number: 17/491,739
- Filed: 2021-10-01
- Published: 2022-09-29
- Granted: 2024-12-31
- Earliest claimed: 2021-03-26
- Assignees: Samsung Electronics Co., Ltd.
- Applicants: Samsung Electronics Co., Ltd.
- Inventors: Sangwoon Lee; Joohyun Jeon; Sungjin Kim; Seunghyun Kim; Wonki Roh; Chulwoo Park; Seongjae Byeon; Taeyoon An; Hyoeun Jung
- Web page: https://patentgrep.com/patent/US12182486B2

## CPC

- G06F 30/3308: using simulation
- G06F 30/25: using particle-based methods
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)

## Abstract

A method of modeling damages to a crystal caused by an incident particle includes obtaining particle information and crystal information; estimating energy loss of the incident particle based on the particle information and the crystal information; estimating a volume of a vacancy based on the energy loss; estimating a vacancy reaction based on the crystal information and the volume of the vacancy; and generating output data based on the vacancy reaction, the output data including quantification data of the damages.

## Claims

### Claim 1

A method of modeling damages to a crystal caused by an incident particle, the method comprising:
obtaining particle information and crystal information;
estimating energy loss of the incident particle based on the particle information and on the crystal information;
estimating a volume of a vacancy based on the energy loss;
estimating a vacancy reaction based on the crystal information and on the volume of the vacancy; and
generating output data based on the vacancy reaction, the output data including quantification data of the damages to verify design of integrated circuit before fabrication.

### Claim 2 (depends on 1)

The method of claim 1, wherein the estimating of the volume of the vacancy includes:
estimating a first volume of the vacancy caused by the energy loss;
estimating a second volume caused by diffusion of the vacancy; and
calculating the volume of the vacancy based on a sum of the first volume and the second volume.

### Claim 3 (depends on 2)

The method of claim 2, wherein the estimating of the first volume includes calculating the first volume based on a polynomial of the energy loss.

### Claim 4 (depends on 3)

The method of claim 3, wherein the polynomial includes a 3rd order polynomial of the energy loss.

### Claim 5 (depends on 2)

The method of claim 2, wherein the estimating of the second volume includes calculating the second volume based on a diffusivity of the vacancy and on a lifetime of the vacancy.

### Claim 6 (depends on 5)

The method of claim 5, wherein the calculating of the second volume includes calculating the second volume based on the equation:
Voldiffusion=A×(√{square root over (DV×τlifetime)})3,
wherein Voldiffusion is the second volume, A is a constant, DV is the diffusivity of the vacancy, and τlifetime is the lifetime of the vacancy.

### Claim 7 (depends on 1)

The method of claim 1, wherein the estimating of the vacancy reaction includes:
obtaining an initial dopant concentration from the crystal information;
calculating a first equilibrium constant based on the crystal information; and
estimating a dopant concentration based on the initial dopant concentration, the volume of the vacancy, and the first equilibrium constant.

### Claim 8 (depends on 1)

The method of claim 1, wherein the estimating of the vacancy reaction includes:
obtaining an initial dopant concentration from the crystal information;
calculating a rate of change of a combination concentration of a dopant and the vacancy, the calculating the rate of change based on the initial dopant concentration and on the volume of the vacancy; and
estimating a dopant concentration based on the initial dopant concentration and on the combination concentration of the dopant and the vacancy.

### Claim 9 (depends on 1)

The method of claim 1, wherein the estimating of the vacancy reaction includes:
obtaining an initial impurity concentration from the crystal information;
calculating a second equilibrium constant based on the crystal information;
estimating a combination concentration of an impurity and the vacancy, the estimating the combination concentration based on the initial impurity concentration, the volume of the vacancy, and the second equilibrium constant; and
calculating a trap concentration based on a sum of (A) a combined concentration of a dopant and the vacancy and (B) the combination concentration of the impurity and the vacancy.

### Claim 10 (depends on 1)

The method of claim 1, wherein the estimating of the vacancy reaction includes:
extracting an initial impurity concentration from the crystal information;
calculating a rate of change of a combination concentration of an impurity and the vacancy, the calculating the rate of change based on the initial impurity concentration and on the volume of the vacancy; and
calculating a trap concentration based on a sum of (A) a combination concentration of a dopant and the vacancy and (B) the combination concentration of the impurity and the vacancy.

### Claim 11 (depends on 1)

A method of manufacturing an integrated circuit, the method comprising:
producing at least one mask based on design data, the design data verified based on the output data of claim 1; and
manufacturing the integrated circuit using the at least one mask.

### Claim 12

A system comprising:
at least one processor; and
a non-transitory storage medium storing instructions that, when executed by the at least one processor, cause the at least one processor to perform operations for modeling damages to a crystal caused by an incident particle,
wherein the operations comprise,
obtaining particle information and crystal information,
estimating energy loss of the incident particle based on the particle information and on the crystal information,
estimating a volume of a vacancy based on the energy loss,
estimating a vacancy reaction based on the crystal information and on the volume of the vacancy, and
generating output data based on the vacancy reaction, the output data including quantification data of the damages to verify design of integrated circuit before fabrication.

### Claim 13 (depends on 12)

The system of claim 12, wherein the estimating the volume of the vacancy includes:
estimating a first volume of the vacancy caused by the energy loss;
estimating a second volume caused by diffusion of the vacancy; and
calculating the volume of the vacancy based on a sum of the first volume and the second volume.

### Claim 14

A method of modeling damages to a crystal caused by an incident particle, the method comprising:
obtaining particle information and crystal information;
estimating energy loss of the incident particle based on the particle information and on the crystal information;
estimating a volume of a vacancy based on the energy loss,
wherein the estimating of the volume of the vacancy includes,
estimating a first volume of the vacancy caused by the energy loss,
estimating a second volume caused by diffusion of the vacancy, and
calculating the volume of the vacancy based on a sum of the first volume and the second volume;
estimating a vacancy reaction based on the crystal information and on the volume of the vacancy; and
generating output data based on the vacancy reaction, the output data including quantification data of the damages to verify design of integrated circuit before fabrication.

### Claim 15 (depends on 14)

The method of claim 14, wherein the estimating of the second volume includes calculating the second volume based on a diffusivity of the vacancy and on a lifetime of the vacancy.

### Claim 16 (depends on 14)

The method of claim 14, further comprising:
estimating a vacancy reaction based on the crystal information and on the volume of the vacancy; and
generating output data based on the vacancy reaction, the output data including quantification data of the damages.

### Claim 17 (depends on 16)

The method of claim 16, wherein the estimating of the vacancy reaction includes:
obtaining an initial dopant concentration from the crystal information;
calculating a first equilibrium constant based on the crystal information; and
estimating a dopant concentration based on the initial dopant concentration, the volume of the vacancy, and the first equilibrium constant.

### Claim 18 (depends on 16)

The method of claim 16, wherein the estimating of the vacancy reaction includes:
obtaining an initial dopant concentration from the crystal information;
calculating a rate of change of a combination concentration of a dopant and the vacancy based on the initial dopant concentration and the volume of the vacancy; and
estimating a dopant concentration based on the initial dopant concentration and the combination concentration of the dopant and the vacancy.

### Claim 19 (depends on 16)

The method of claim 16, wherein the estimating of the vacancy reaction includes:
obtaining an initial impurity concentration from the crystal information;
calculating a second equilibrium constant based on the crystal information;
estimating a combination concentration of an impurity and the vacancy based on the initial impurity concentration, the volume of the vacancy, and the second equilibrium constant; and
calculating a trap concentration based on a sum of (A) a combination concentration of a dopant and the vacancy and (B) the combination concentration of the impurity and the vacancy.

### Claim 20 (depends on 16)

The method of claim 16, wherein the estimating of the vacancy reaction includes:
obtaining an initial impurity concentration from the crystal information;
calculating a rate of change of a combination concentration of an impurity and the vacancy based on the initial impurity concentration and the volume of the vacancy; and
calculating a trap concentration by summing a combination concentration of a dopant and the vacancy and the combination concentration of the impurity and the vacancy.