# US 12,181,652 B2 · Method for generating an image by means of a microscope and corresponding microscope

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- Number: US 12,181,652 B2
- Document ID: US12181652B2
- Status: Granted
- Kind: B2
- Application number: 17/427,965
- Filed: 2020-01-27
- Published: 2022-04-28
- Granted: 2024-12-31
- Earliest claimed: 2019-02-06
- Assignees: Leica Microsystems CMS GmbH
- Applicants: Leica Microsystems Cms GmbH
- Inventors: Patric Pelzer
- Web page: https://patentgrep.com/patent/US12181652B2

## CPC

- G02B 21/365: {Control or image processing arrangements for digital or video microscopes (G02B21/361, G02B21/362 take precedence)}
- G02B 21/0032: {Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers (G02B21/0036 - G02B21/008; means for illumination of specimens in general G02B21/06)}
- G02B 21/008: {Details of detection or image processing, including general computer control}
- G03B 7/00: Control of exposure by setting shutters, diaphragms or filters, separately or conjointly (control of exposure in television cameras by means of circuitry influencing the optical part of the camera H04N23/75)
- H04N 23/61: based on recognised objects
- H04N 23/72: Combination of two or more compensation controls
- G02B: OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G03B: APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR (optical parts of such apparatus G02B; photosensitive materials or processes for photographic purposes G03C; apparatus for processing exposed photographic materials G03D)
- H04N: PICTORIAL COMMUNICATION, e.g. TELEVISION

## Abstract

A method for image generation by means of a microscope includes: locating a sample to be imaged in an object space of the microscope for the image generation using specified image generation parameters; firstly detecting a movement or an intended movement of the sample; and thereupon automatically changing at least one image generation parameter during the movement of the sample depending on a movement variable.

## Claims

### Claim 1

A method for image generation by means of a microscope, wherein a sample to be imaged is located in an object space of the microscope for the image generation using specified image generation parameters, the method comprising:
detecting a movement or an intended movement of the sample;
comparing a movement variable of the movement or the intended movement to a specified threshold value, wherein the specified threshold value is non-zero and comprises a minimum movement distance, a minimum velocity, or a minimum acceleration; and
upon determining that the movement variable exceeds the specified threshold value, automatically changing at least one image generation parameter during the movement of the sample depending on the movement variable, wherein the change of the at least one image generation parameter is performed dynamically, such that the at least one image generation parameter is changed continuously as a function of the movement variable.

### Claim 2 (depends on 1)

The method of claim 1, wherein an amount of the change of the at least one image generation parameter is proportional to the movement variable of the movement or the intended movement.

### Claim 3 (depends on 1)

The method of claim 1, wherein the intended movement of the sample is detected when a user input to change a position of the sample takes place.

### Claim 4 (depends on 1)

The method of claim 1, wherein an image frequency is increased and/or an exposure time is reduced as the image generation parameter.

### Claim 5 (depends on 1)

The method of claim 1, wherein a reduction of an amount of light detected for the image generation or a signal strength used for the image generation, which reduction accompanies a change of the at least one image generation parameter, is compensated for.

### Claim 6 (depends on 5)

The method of claim 5, wherein the compensation of the reduction of a measured amount of light is performed by an increase of an amplification of a sensor used for imaging, an increase of an illumination intensity of an illumination unit used for illumination, an enlargement of a pinhole used in a confocal microscope, a reduction of a resolution, and/or an adaptation of an image contrast in a generated image.

### Claim 7 (depends on 1)

The method according to claim 1, wherein an end of the movement of the sample is detected, and after the end of the movement, the image generation parameters set before the movement of the sample are set again, or new image generation parameters are set.

### Claim 8 (depends on 1)

The method according to claim 1, wherein a wide-field microscope having a light-sensitive detector is used for the imaging as the microscope and an exposure time of the light-sensitive detector is shortened as the image generation parameter.

### Claim 9 (depends on 1)

The method of claim 1, wherein a confocal microscope is used as the microscope and a scanner frequency of a scanning unit of the confocal microscope is increased, or a scanning resolution of the scanning unit is reduced, as the image generation parameter.

### Claim 10

A microscope, comprising:
a microscope objective;
an image generation unit downstream of the microscope objective in an observation beam path of the microscope for image generation using settable image generation parameters;
a microscope table configured to accommodate a sample to be imaged;
a positioning unit configured to position the sample in an object space of the microscope, wherein the positioning unit has a communication connection to the image generation unit; and
a control unit having a communication connection to the positioning unit and the image generation unit, wherein the control unit is configured to, after detection of a movement or an intended movement of the sample and upon determining that a movement variable of the movement or the intended movement exceeds a specified threshold value, change at least one image generation parameter during the movement of the sample depending on the movement variable, the specified threshold value being non-zero and comprising a minimum movement distance, a minimum velocity, or a minimum acceleration, wherein the control unit is configured to change the at least one image generation parameter continuously during the movement of the sample as a function of the movement variable.

### Claim 11 (depends on 10)

The microscope of claim 10,
wherein the control unit is configured to change the at least one image generation parameter so that an amount of change is proportional to the movement variable.

### Claim 12 (depends on 10)

The microscope of claim 10, further comprising:
an evaluation unit configured to detect the movement of the sample, the evaluation unit being configured such that positioning signals for the positioning unit are evaluated and/or a position-sensitive measurement beam signal of a measurement beam reflected from the sample is evaluated and/or an image recorded by the sample is evaluated by image processing.

### Claim 13 (depends on 10)

The microscope of claim 10, further comprising:
an illumination unit configured to generate an illumination beam path oriented on the sample,
wherein an illumination intensity of the illumination beam path is settable.

### Claim 14 (depends on 10)

The microscope of claim 10, further comprising:
a memory unit configured to store set image generation parameters.

### Claim 15 (depends on 10)

The microscope of claim 10, wherein the control unit is configured such that the intended movement of the sample is detected when a user input to change the position of the sample takes place via a user interface.

### Claim 16 (depends on 10)

The microscope of claim 10, wherein the microscope comprises a wide-field microscope, and
wherein the microscope further comprises a light-sensitive detector configured to image using changeable exposure time.

### Claim 17 (depends on 10)

The microscope of claim 10, wherein the microscope comprises a confocal microscope,
wherein the microscope further comprises a scanning unit configured to scan an illumination beam path over the sample to be imaged, and
wherein a scanner frequency or a scanning resolution of the scanning unit is changeable.

### Claim 18

A non-transitory computer-readable medium having processor-executable instructions stored thereon, wherein the processor-executable instructions, when executed on a processing unit of a microscope, facilitate carrying out a method for image generation by means of the microscope, wherein a sample to be imaged is located in an object space of the microscope for the image generation using specified image generation parameters, the method comprising:
detecting a movement or an intended movement of the sample;
comparing a movement variable of the movement or the intended movement to a specified threshold value, wherein the specified threshold value is non-zero and comprises a minimum movement distance, a minimum velocity, or a minimum acceleration; and
upon determining that the movement variable exceeds the specified threshold value, automatically changing at least one image generation parameter during the movement of the sample depending on the movement variable, wherein the change of the at least one image generation parameter is performed dynamically, such that the at least one image generation parameter is changed continuously as a function of the movement variable.
