# US 12,181,536 B2 · Testing circuit for testing universal serial bus

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- Number: US 12,181,536 B2
- Document ID: US12181536B2
- Status: Granted
- Kind: B2
- Application number: 18/178,514
- Filed: 2023-03-05
- Published: 2024-07-25
- Granted: 2024-12-31
- Earliest claimed: 2023-01-19
- Assignees: ASMedia Technology Inc.
- Applicants: ASMedia Technology Inc.
- Inventors: Te-Ming Kung; Yi-Chung Tsai; Shih-Min Lin
- Web page: https://patentgrep.com/patent/US12181536B2

## CPC

- G01R 31/66: Testing of connections, e.g. of plugs or non-disconnectable joints (testing for incorrect line connections G01R31/55)
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

A testing circuit for testing a universal serial bus (USB) of an electronic device includes a controller, a first switch, a pull-down resistor, a gating pull-up resistor, and a second switch. The controller provides a control signal according to a power receiving condition of the electronic device. A control terminal of the first switch is coupled to the controller. The pull-down resistor is coupled between a configuration channel pin of the USB and a first terminal of the first switch. The gating pull-up resistor is coupled between the configuration channel pin and the control terminal of the first switch. A control terminal of the second switch is coupled to the controller. A first terminal of the second switch is coupled to a second terminal of the first switch and a ground pin of the USB. A second terminal of the second switch is coupled to a reference low voltage.

## Claims

### Claim 1

A testing circuit, configured to test a universal serial bus (USB) of an electronic device, wherein the testing circuit comprises:
a controller, configured to provide a control signal according to a power receiving condition of the electronic device;
a first switch, and a control terminal of the first switch being coupled to the controller;
a pull-down resistor, coupled between a configuration channel pin of the USB and a first terminal of the first switch;
a gating pull-up resistor, coupled between the configuration channel pin and the control terminal of the first switch; and
a second switch, a control terminal of the second switch being coupled to the controller, a first terminal of the second switch being coupled to a second terminal of the first switch and a ground pin of the USB, and a second terminal of the second switch being coupled to a reference low voltage.

### Claim 2 (depends on 1)

The testing circuit according to claim 1, wherein when the electronic device does not receive a power source, the control signal is a high impedance signal.

### Claim 3 (depends on 2)

The testing circuit according to claim 2, wherein:
when the ground pin is grounded, the configuration channel pin receives a test voltage,
the first switch is turned on in response to the test voltage, and
a resistance value between the configuration channel pin and the ground pin is substantially equal to a resistance value of the pull-down resistor.

### Claim 4 (depends on 2)

The testing circuit according to claim 2, wherein:
when the ground pin is floating, the configuration channel pin receives a test voltage,
the first switch is turned off, and
a resistance value between the configuration channel pin and the ground pin is equal to a high impedance value.

### Claim 5 (depends on 1)

A testing circuit according to claim 1, wherein when the control signal has a low voltage value, the first switch and the second switch are turned off in response to the low voltage value, and a resistance value between the configuration channel pin and the ground pin is equal to a high impedance value.

### Claim 6 (depends on 5)

The testing circuit according to claim 5, wherein when the electronic device does not receive the power source, the control signal has the low voltage value.

### Claim 7 (depends on 1)

The testing circuit according to claim 1, wherein when the electronic device receives a power source, the control signal has a high voltage value, the first switch and the second switch are turned on in response to the high voltage value, and a resistance value between the configuration channel pin and the ground pin is substantially equal to a resistance value of the pull-down resistor.

### Claim 8 (depends on 1)

The testing circuit according to claim 1, wherein the first switch and the second switch are transistor switches.

### Claim 9 (depends on 1)

The testing circuit according to claim 1, further comprising:
a buffer circuit, coupled to the controller and configured to shift a voltage level of the control signal.

### Claim 10 (depends on 9)

The testing circuit according to claim 9, wherein the buffer circuit comprises:
a first buffer, an input terminal of the first buffer being coupled to the controller, and an output terminal of the first buffer being coupled to the control terminal of the first switch; and
a second buffer, an input terminal of the second buffer being coupled to the controller, and an output terminal of the second buffer being coupled to the control terminal of the second switch.