Apparatus for performing multiple tests on a device under test

An apparatus for performing multiple tests on a device under test (DUT), the apparatus comprising:

• a testing device for testing the DUT;
• at least one non-transitory computer-readable medium having stored thereon computer-executable instructions;
• and
• at least one processor electrically coupled to the testing device and the at least one non-transitory computer-readable medium, wherein the computer-executable instructions are executable by the at least one processor and cause the apparatus to:
• input a first test pattern and a second test pattern together to the testing device for the multiple tests;
• after inputting the first test pattern and the second test pattern together to the testing device, perform the first test pattern on the DUT and obtain a first result for the DUT in response to the first test pattern;
• before obtaining the first result for the DUT in response to the first test pattern and after performing the first test pattern on the DUT, perform the second test pattern on the DUT in sequence automatically;
• and
• after obtaining the first result for the DUT in response to the first test pattern, obtain a second result for the DUT in response to the second test pattern.