# US 12,181,394 B2 · Method and system for trace detection of low volatile substances > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,181,394 B2 - Document ID: US12181394B2 - Status: Granted - Kind: B2 - Application number: 17/470,984 - Filed: 2021-09-09 - Published: 2023-03-09 - Granted: 2024-12-31 - Earliest claimed: 2021-09-09 - Assignees: Analytical Detection LLC - Applicants: Analytical Detection LLC - Inventors: Andrey N Vilkov; Joseph Adam Widjaja; Jack Albert Syage - Web page: https://patentgrep.com/patent/US12181394B2 ## CPC - G01N 1/02: Devices for withdrawing samples {(sampling of foundation soil E02D1/04; collecting or conveying radioactive samples G01T7/00, e.g. G01T7/02, G01T7/08)} - G01N 1/44: Sample treatment involving radiation, e.g. heat - G01N 1/10: in the liquid or fluent state {(burettes, pipettes B01L3/02; sampling of ground water E02D1/06; metering by volume of fluids or fluent solid material G01F11/00, G01F13/00)} - G01N 1/405: {by adsorption or absorption} - G01N 2001/028: {Sampling from a surface, swabbing, vaporising} - G01N 2001/1056: {Disposable (single-use) samplers} - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) ## Abstract A system includes a conductive sampling swab including a non-mesh substrate and a thermal desorber including a clamping assembly configured to releasably hold the conductive sampling swab. The clamping assembly is configured to be electrically connected to a voltage or current source, and the thermal desorber is configured to resistively heat the conductive sampling swab to a temperature sufficient to vaporize a sample material disposed on the conductive sampling swab. ## Claims ### Claim 1 A system comprising: a conductive sampling swab comprising a non-mesh substrate; and a thermal desorber comprising a clamping assembly configured to releasably hold the conductive sampling swab, wherein the clamping assembly is configured to be electrically connected to a voltage or current source, wherein the clamping assembly is configured to move to electrically contact the conductive sampling swab, wherein the clamping assembly is configured to move to electrically disconnect from the conductive sampling swab, and wherein the thermal desorber is configured to resistively heat the conductive sampling swab to a temperature sufficient to vaporize a sample material disposed on the conductive sampling swab. ### Claim 2 (depends on 1) The system of claim 1, wherein the conductive sampling swab has a Young's modulus greater than or equal to 9,000 kilopounds per square inch (ksi), wherein the conductive sampling swab has a resistivity greater than or equal to 50 micro Ohm-centimeters (mW-cm). ### Claim 3 (depends on 1) The system of claim 1, wherein the conductive sampling swab is configured to be reusable and replaceable within the clamping assembly. ### Claim 4 (depends on 1) The system of claim 1, wherein the temperature sufficient to vaporize the sample material disposed on the conductive sampling swab is greater than or equal to 500 degrees Celsius. ### Claim 5 (depends on 1) The system of claim 1, wherein the thermal desorber is configured to at least one of flash heat the conductive sampling swab or heat the conductive sampling swab according to a temperature profile. ### Claim 6 (depends on 1) The system of claim 1, wherein the sample material comprises at least one of an explosive, a narcotic, a chemical warfare agent, a pesticide, a toxic industrial chemical, or a pharmaceutical trace contaminant. ### Claim 7 (depends on 1) The system of claim 1, wherein the sample material comprises at least one of sodium nitrate, potassium nitrate, strontium nitrate, barium nitrate, sodium chlorate, potassium chlorate, sodium perchlorate, potassium perchlorate, sodium permanganate, or potassium permanganate. ### Claim 8 (depends on 1) The system of claim 1, wherein the non-mesh substrate comprises a metal foil. ### Claim 9 (depends on 8) The system of claim 8, wherein the metal foil comprises at least one of 1095 carbon steel or a spring steel. ### Claim 10 (depends on 1) The system of claim 1, wherein the conductive sampling swab has a surface arithmetic roughness average (Ra) of greater than or equal to 0.25 micrometers. ### Claim 11 (depends on 10) The system of claim 10, wherein the conductive sampling swab comprises at least one of a graphite coating or a graphene coating disposed on the non-mesh substrate. ### Claim 12 (depends on 1) The system of claim 1, wherein the clamping assembly is configured to be electrically connected to the conductive sampling swab. ### Claim 13 (depends on 12) The system of claim 12, wherein the clamping assembly is configured to contact the conductive sampling swab with a substantially even pressure over a first area at a first position on the conductive sampling swab and with a substantially even pressure over a second area at a second position on the conductive sampling swab. ### Claim 14 A method comprising: inserting a conductive sampling swab into a thermal desorber, wherein the conductive sampling swab comprises a non-mesh substrate; clamping, via a clamping assembly of the thermal desorber, the conductive sampling swab, wherein the clamping assembly is configured to be electrically connected to a voltage or current source, wherein the clamping assembly is configured to move to electrically contact the conductive sampling swab, wherein the clamping assembly is configured to move to electrically disconnect from the conductive sampling swab; and resistively heating the conductive sampling swab, via a current applied through the conductive sampling swab, to a temperature sufficient to vaporize a sample material disposed on the conductive sampling swab. ### Claim 15 (depends on 14) The method of claim 14, wherein the non-mesh substrate comprises a metal foil. ### Claim 16 (depends on 14) The method of claim 14, wherein the clamping assembly is configured to be electrically connected to the conductive sampling swab. ### Claim 17 (depends on 16) The method of claim 16, wherein the clamping assembly is configured to contact the conductive sampling swab with an even pressure over a first area at a first position on the conductive swab and with an even pressure over a second area at a second position on the conductive swab.