# US 12,181,350 B2 · Temperature sensor with delta base-emitter voltage amplification and digital curvature correction

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- Number: US 12,181,350 B2
- Document ID: US12181350B2
- Status: Granted
- Kind: B2
- Application number: 17/524,988
- Filed: 2021-11-12
- Published: 2023-05-18
- Granted: 2024-12-31
- Earliest claimed: 2021-11-12
- Assignees: Analog Devices International Unlimited Company
- Applicants: Analog Devices International Unlimited Company
- Inventors: Gaurav Singh; Wreeju Bhaumik
- Web page: https://patentgrep.com/patent/US12181350B2

## CPC

- G01K 15/005: {Calibration}
- G01K 7/01: using semiconducting elements having PN junctions (G01K7/02, G01K7/16, G01K7/30 take precedence)
- G01K 2219/00: Thermometers with dedicated analog to digital converters
- G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR (radiation pyrometry G01J5/00)

## Abstract

Systems, devices, and methods related to temperature sensors for electronic devices are provided. An example temperature sensor device includes analog temperature sensor circuitry to generate a plurality of voltages indicative of a temperature; an analog-to-digital converter (ADC) disposed downstream of the analog temperature sensing circuitry; switched-capacitor amplifier circuitry disposed before the ADC, the switched-capacitor amplifier circuitry comprising a single-ended amplifier to amplify the plurality of voltages with respect to a common voltage; a first switch coupled between the analog temperature sensor circuitry and the switched-capacitor amplifier circuitry to provide a sampling phase and an integration phase; and digital calculation circuitry to calculate a temperature value based on the plurality of amplified voltages.

## Claims

### Claim 1

A temperature sensor device comprising:
analog temperature sensor circuitry to generate a plurality of voltages indicative of a temperature;
an analog-to-digital converter (ADC) disposed downstream of the analog temperature sensor circuitry; and
switched-capacitor amplifier circuitry disposed before the ADC, the switched-capacitor amplifier circuitry comprising a single-ended amplifier, a second switch coupled between a first input and an output of the single-ended amplifier, and a third switch having a first terminal and a second terminal, wherein the first terminal is coupled to a first switch and the second terminal is directly coupled to a second input of the single-ended amplifier;
wherein the first switch is coupled between the analog temperature sensor circuitry and the switched-capacitor amplifier circuitry.

### Claim 2 (depends on 1)

The temperature sensor device of claim 1, wherein the switched-capacitor amplifier circuitry further comprises:
a first capacitor coupled between the first switch and the first input of the single-ended amplifier via the first switch; and
a second capacitor coupled between the first input and the output of the single-ended amplifier.

### Claim 3 (depends on 1)

The temperature sensor device of claim 1, further comprising:
a multiplexer having inputs coupled to the switched-capacitor amplifier circuitry and the analog temperature sensor circuitry and an output coupled to the ADC.

### Claim 4 (depends on 1)

The temperature sensor device of claim 1, wherein:
the analog temperature sensor circuitry further comprises:
a transistor comprising a base, an emitter, and a collector; and
a plurality of current sources and a plurality of switches to selectively provide a first amount of current and a second amount of current to the transistor, the transistor generating a first base-emitter voltage responsive to the first amount of current and a second base-emitter voltage responsive to the second amount of current, and the plurality of voltages including the first base-emitter voltage and the second base-emitter voltage; and
the switched-capacitor amplifier circuitry amplifies each of the first base-emitter voltage and the second base-emitter voltage with respect to a common voltage.

### Claim 5 (depends on 4)

The temperature sensor device of claim 4, further comprising:
biasing circuitry comprising:
a second transistor comprising a second base, a second emitter coupled to the second input of the single-ended amplifier, and a second collector; and
a further current source to provide a third amount of current to the second transistor, wherein the second transistor generates a third base-emitter voltage responsive to the third amount of current, and wherein the third base-emitter voltage is provided as the common voltage to the switched-capacitor amplifier circuitry.

### Claim 6 (depends on 4)

The temperature sensor device of claim 4, wherein:
the ADC converts an amplified first base-emitter voltage to a first digital value and an amplified second base-emitter voltage to a second digital value; and
the temperature sensor device further comprises:
processing circuitry to calculate a temperature value based at least in part on the first digital value, the second digital value, and a predetermined scaling factor associated with at least an inverse of a digital bandgap reference.

### Claim 7 (depends on 6)

The temperature sensor device of claim 6, further comprising:
memory to store the predetermined scaling factor associated with at least the inverse of the digital bandgap reference.

### Claim 8 (depends on 6)

The temperature sensor device of claim 6, wherein the processing circuitry further adjusts the temperature value by a predetermined digital temperature- dependent compensation value.

### Claim 9 (depends on 8)

The temperature sensor device of claim 8, further comprising:
memory to store a plurality of digital temperature-dependent compensation values including the predetermined digital temperature-dependent compensation value.
