# US 12,181,338 B2 · Luminous flux test circuitry, test method and display panel > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,181,338 B2 - Document ID: US12181338B2 - Status: Granted - Kind: B2 - Application number: 17/925,214 - Filed: 2021-12-27 - Published: 2024-07-11 - Granted: 2024-12-31 - Earliest claimed: 2021-12-27 - Assignees: Beijing Boe Optoelectronics Technology Co., Ltd.; Boe Technology Group Co., Ltd. - Applicants: Beijing BOE Optoelectronics Technology Co., Ltd.; BOE Technology Group Co., Ltd. - Inventors: Yifan Song; Wenchao Han; Zhaohui Meng; Wei Sun - Web page: https://patentgrep.com/patent/US12181338B2 ## CPC - G01J 1/44: Electric circuits {(for command of an exposure part G03B7/02)} - G01R 31/2656: {using non-ionising electromagnetic radiation, e.g. optical radiation} - G09G 3/36: using liquid crystals - G01J 2001/4247: {for testing lamps or other light sources} - G01J 2001/4473: {Phototransistor} - G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N) - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - G09G: ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION (arrangements for transferring data between digital computers and displays G06F3/14; static indicating arrangements comprising an association of a number of separate sources or light control cells G09F9/00; static indicating arrangements comprising integral associations of a number of light sources H01J, H01K, H10H, H05B33/12; scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission, details thereof H04N1/00) ## Abstract The present disclosure provides a luminous flux test circuitry, a test method and a display panel. The luminous flux test circuitry includes two test sub-circuitries, a control sub-circuitry and a light-shielding pattern. Each test sub-circuitry includes N photosensitive transistors; an output end of each photosensitive transistor in a first test sub-circuitry is coupled to a first input end of the control sub-circuitry; an output end of each photosensitive transistor in a second test sub-circuitry is coupled to a second input end of the control sub-circuitry; the light-shielding pattern covers the photosensitive transistors in the second test sub-circuitry; at a sampling stage, the photosensitive transistors in each test sub-circuitry are in a reverse bias state; and the control sub-circuitry is configured to determine a luminous flux detected by the photosensitive transistors in the first test sub-circuitry in accordance with a leakage current generated by the photosensitive transistors in each test sub-circuitry. ## Claims ### Claim 1 A luminous flux test circuitry, comprising two test sub-circuitries, a control sub-circuitry and a light-shielding pattern, wherein each of the two test sub-circuitries comprises N photosensitive transistors, where N is a positive integer greater than or equal to 1; an output end of each of the N photosensitive transistors in a first test sub-circuitry of the two test sub-circuitries is coupled to a first input end of the control sub-circuitry; an output end of each of the N photosensitive transistors in a second test sub-circuitry of the two test sub-circuitries is coupled to a second input end of the control sub-circuitry; the light-shielding pattern covers the N photosensitive transistors in the second test sub-circuitry; at a sampling stage, the N photosensitive transistors in each test sub-circuitry are in a reverse bias state; and the control sub-circuitry is configured to determine luminous flux detected by the N photosensitive transistors in the first test sub-circuitry in accordance with a leakage current generated by the N photosensitive transistors in each test sub-circuitry. ### Claim 2 (depends on 1) The luminous flux test circuitry according to claim 1, wherein each of the two test sub-circuitries further comprises a reversed-phase integrator, a first input end of the reversed-phase integrator is coupled to the output end of each of the N photosensitive transistors, and a second input end of the reversed-phase integrator is coupled to a grounded signal; an output end of the reversed-phase integrator in the first test sub-circuitry is coupled to the first input end of the control sub-circuitry, and an output end of the reversed-phase integrator in the second test sub-circuitry is coupled to the second input end of the control sub-circuitry; and at the sampling stage, the reversed-phase integrator in the first test sub-circuitry is configured to store electric charges generated by the leakage current in the N photosensitive transistors coupled to the reversed-phase integrator to obtain a first output voltage, and transmit the first output voltage to the first input end of the control sub-circuitry; the reversed-phase integrator in the second test sub-circuitry is configured to store electric charges generated by the leakage current in the N photosensitive transistors coupled to the reversed-phase integrator to obtain a second output voltage, and transmit the second output voltage to the second input end of the control sub-circuitry; and the control sub-circuitry is configured to determine the luminous flux detected by the N photosensitive transistors in the first test sub-circuitry in accordance with the first output voltage and the second output voltage. ### Claim 3 (depends on 2) The luminous flux test circuitry according to claim 2, wherein each reversed-phase integrator comprises a first operational amplifier, a first resistor unit, a second resistor unit, and a capacitor unit; a first end of the first resistor unit is used as the first input end of the reversed-phase integrator, and a second end of the first resistor unit is coupled to a first input end of the first operational amplifier; a first end of the second resistor unit is used as the second input end of the reversed-phase integrator, and a second end of the second resistor unit is coupled to a second input end of the first operational amplifier; and a first end of the capacitor unit is coupled to the first input end of the first operational amplifier, a second end of the capacitor unit is coupled to an output end of the first operational amplifier, and the output end of the first operational amplifier is used as the output end of the reversed-phase integrator. ### Claim 4 (depends on 3) The luminous flux test circuitry according to claim 3, wherein each test sub-circuitry further comprises a control unit coupled to a control signal input end, the first end of the capacitor unit and the second end of the capacitor unit, and configured to control the first end of the capacitor unit to be electrically coupled to or electrically decoupled from the second end of the capacitor unit under the control of a control signal from the control signal input end. ### Claim 5 (depends on 4) The luminous flux test circuitry according to claim 4, wherein the control sub-circuitry comprises a first analog-to-digital converter, a second analog-to-digital converter and a control chip; an input end of the first analog-to-digital converter is used as the first input end of the control sub-circuitry, and an output end of the first analog-to-digital converter is coupled to the control chip; and an input end of the second analog-to-digital converter is used as the second input end of the control sub-circuitry, and an output end of the second analog-to-digital converter is coupled to the control chip. ### Claim 6 (depends on 2) The luminous flux test circuitry according to claim 2, wherein the control sub-circuitry comprises a first analog-to-digital converter, a second analog-to-digital converter and a control chip; an input end of the first analog-to-digital converter is used as the first input end of the control sub-circuitry, and an output end of the first analog-to-digital converter is coupled to the control chip; and an input end of the second analog-to-digital converter is used as the second input end of the control sub-circuitry, and an output end of the second analog-to-digital converter is coupled to the control chip. ### Claim 7 (depends on 3) The luminous flux test circuitry according to claim 3, wherein each test sub-circuitry further comprises a reversed-phase operational amplifier, an in-phase input end of the reversed-phase operational amplifier is coupled to the grounded signal, and a reversed-phase input end of the reversed-phase operational amplifier is coupled to the output end of the first operational amplifier; an output end of the reversed-phase operational amplifier in the first test sub-circuitry is coupled to the first input end of the control sub-circuitry; and an output end of the reversed-phase operational amplifier in the second test sub-circuitry is coupled to the second input end of the control sub-circuitry. ### Claim 8 (depends on 7) The luminous flux test circuitry according to claim 7, wherein the control sub-circuitry comprises a first analog-to-digital converter, a second analog-to-digital converter and a control chip; an input end of the first analog-to-digital converter is used as the first input end of the control sub-circuitry, and an output end of the first analog-to-digital converter is coupled to the control chip; and an input end of the second analog-to-digital converter is used as the second input end of the control sub-circuitry, and an output end of the second analog-to-digital converter is coupled to the control chip. ### Claim 9 (depends on 3) The luminous flux test circuitry according to claim 3, wherein the control sub-circuitry comprises a first analog-to-digital converter, a second analog-to-digital converter and a control chip; an input end of the first analog-to-digital converter is used as the first input end of the control sub-circuitry, and an output end of the first analog-to-digital converter is coupled to the control chip; and an input end of the second analog-to-digital converter is used as the second input end of the control sub-circuitry, and an output end of the second analog-to-digital converter is coupled to the control chip. ### Claim 10 (depends on 1) The luminous flux test circuitry according to claim 1, wherein the control sub-circuitry comprises a first analog-to-digital converter, a second analog-to-digital converter and a control chip; an input end of the first analog-to-digital converter is used as the first input end of the control sub-circuitry, and an output end of the first analog-to-digital converter is coupled to the control chip; and an input end of the second analog-to-digital converter is used as the second input end of the control sub-circuitry, and an output end of the second analog-to-digital converter is coupled to the control chip. ### Claim 11 (depends on 1) The luminous flux test circuitry according to claim 1, wherein in the case that N is greater than 1, gate electrodes of the N photosensitive transistors are coupled to each other and input ends of the N photosensitive transistors are coupled to each other in a same test sub-circuitry. ### Claim 12 (depends on 11) The luminous flux test circuitry according to claim 11, wherein the gate electrodes of the N photosensitive transistors in the first test sub-circuitry are coupled to the gate electrodes of the N photosensitive transistors in the second test sub-circuitry; and the input ends of the N photosensitive transistors in the first test sub-circuitry are coupled to the input ends of the N photosensitive transistors in the second test sub-circuitry. ### Claim 13 (depends on 1) A luminous flux test method, for the luminous flux test circuitry according to claim 1, comprising, at the sampling stage, enabling the N photosensitive transistors in each test sub-circuitry to be in the reverse bias state, and determining, by the control sub-circuitry, the luminous flux detected by the N photosensitive transistors in the first test sub-circuitry in accordance with the leakage current generated by the N photosensitive transistors in each test sub-circuitry. ### Claim 14 (depends on 13) The luminous flux test method according to claim 13, wherein each of the two test sub-circuitries further comprises a reversed-phase integrator, a first input end of the reversed-phase integrator is coupled to an output end of each of the N photosensitive transistors, a second input end of the reversed-phase integrator is coupled to a grounded signal, an output end of the reversed-phase integrator in the first test sub-circuitry is coupled to the first input end of the control sub-circuitry, and an output end of the reversed-phase integrator in the second test sub-circuitry is coupled to the second input end of the control sub-circuitry, wherein the determining, by the control sub-circuitry, the luminous flux detected by the N photosensitive transistors in the first test sub-circuitry in accordance with the leakage current generated by the N photosensitive transistors in each test sub-circuitry comprises: storing, by the reversed-phase integrator in the first test sub-circuitry, electric charges generated by the leakage current in the N photosensitive transistors coupled to the reversed-phase integrator to obtain a first output voltage, and transmitting the first output voltage to the first input end of the control sub-circuitry; storing, by the reversed-phase integrator in the second test sub-circuitry, electric charges generated by the leakage current in the N photosensitive transistors coupled to the reversed-phase integrator to obtain a second output voltage, and transmitting the second output voltage to the second input end of the control sub-circuitry; and determining, by the control sub-circuitry, the luminous flux detected by the N photosensitive transistors in the first test sub-circuitry in accordance with the first output voltage and the second output voltage. ### Claim 15 (depends on 14) The luminous flux test method according to claim 14, further comprising, at a resetting stage, resetting the N photosensitive transistors in each of the two test sub-circuitries. ### Claim 16 (depends on 15) The luminous flux test method according to claim 15, wherein each reversed-phase integrator comprises a first operational amplifier, a first resistor unit, a second resistor unit, and a capacitor unit, a first end of the first resistor unit is used as the first input end of the reversed-phase integrator, and a second end of the first resistor unit is coupled to a first input end of the first operational amplifier, a first end of the second resistor unit is used as the second input end of the reversed-phase integrator, and a second end of the second resistor unit is coupled to a second input end of the first operational amplifier, a first end of the capacitor unit is coupled to the first input end of the first operational amplifier, a second end of the capacitor unit is coupled to an output end of the first operational amplifier, and the output end of the first operational amplifier is used as the output end of the reversed-phase integrator, the test sub-circuitry further comprises a control unit coupled to a control signal input end, the first end of the capacitor unit and the second end of the capacitor unit, wherein the luminous flux test method further comprises: at the sampling stage, controlling, by the control unit, the first end of the capacitor unit to be electrically decoupled from the second end of the capacitor unit under the control of a control signal from the control signal input end; and at the resetting stage, controlling, by the control unit, the first end of the capacitor unit to be electrically coupled to the second end of the capacitor unit under the control of the control signal from the control signal input end. ### Claim 17 (depends on 1) A display panel, integrated with the luminous flux test circuitry according to claim 1. ### Claim 18 (depends on 17) The display panel according to claim 17, wherein the display panel comprises a thin film transistor, a type of each of the photosensitive transistors in the luminous flux test circuitry is the same as a type of the thin film transistor, and the photosensitive transistors and the thin film transistor are formed at the same time. ### Claim 19 (depends on 17) The display panel according to claim 17, further comprising a first signal line and a second signal line, the first signal line is coupled to the gate electrodes of the photosensitive transistors, and the second signal line is coupled to the input ends of the photosensitive transistors.