# US 12,181,273 B2 · Three-dimensional measurement device

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- Number: US 12,181,273 B2
- Document ID: US12181273B2
- Status: Granted
- Kind: B2
- Application number: 17/175,059
- Filed: 2021-02-12
- Published: 2021-08-26
- Granted: 2024-12-31
- Earliest claimed: 2020-02-21
- Assignees: Hamamatsu Photonics K.K.
- Applicants: Hamamatsu Photonics K.K.
- Inventors: Kazuyoshi Hirose; Hiroki Kamei; Takahiro Sugiyama; Akiyoshi Watanabe
- Web page: https://patentgrep.com/patent/US12181273B2

## CPC

- G01B 11/2513: {with several lines being projected in more than one direction, e.g. grids, patterns}
- G06T 7/521: from laser ranging, e.g. using interferometry; from the projection of structured light
- G06V 10/145: Illumination specially adapted for pattern recognition, e.g. using gratings
- H01S 5/11: Comprising a photonic bandgap structure
- G06V 2201/12: Acquisition of 3D measurements of objects
- G06V 2201/121: using special illumination
- H01S 5/0014: {Measuring characteristics or properties thereof (measuring techniques per se G01J, G01K, G01N, G01R)}
- H01S 5/185: having only horizontal cavities, e.g. horizontal cavity surface-emitting lasers [HCSEL] (comprising a photonic bandgap structure H01S5/11)
- H01S 5/42: Arrays of surface emitting lasers
- H01S 2301/02: ASE (amplified spontaneous emission), noise; Reduction thereof
- G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06V: IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- H01S: DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL

## Abstract

A three-dimensional measurement device includes one or a plurality of light source units configured to irradiate the object to be measured SA with measurement light having a predetermined pattern, one or a plurality of image capture units configured to capture an image of the object to be measured which is irradiated with the measurement light, and a measurement unit configured to measure a three-dimensional shape of the object to be measured on the basis of results of image capture performed by the image capture units. The light source units are constituted by an S-iPMSEL of M-point oscillation.

## Claims

### Claim 1

A three-dimensional measurement device comprising:
one or a plurality of light source units configured to irradiate an object to be measured with measurement light having a predetermined pattern;
one or a plurality of image capture units configured to capture an image of the object to be measured which is irradiated with the measurement light; and
a measurement unit configured to measure a three-dimensional shape of the object to be measured on the basis of results of image capture performed by the image capture units,
wherein the light source units are constituted by an S-iPMSEL of M-point oscillation that outputs light of a band edge wavelength at M-point, and
the S-iPMSEL comprising:
an active layer; and
a phase modulation layer optically coupled with the active layer,
wherein the phase modulation layer comprises a fundamental layer and a plurality of different refractive index regions differing in refractive index from the fundamental layer and distributed two-dimensionally in a plane perpendicular to a thickness direction of the phase modulation layer and, when a virtual square lattice is set in the plane, respective centers of gravity of each different refractive index region is set at a position shifted from a lattice point position of a virtual square lattice in accordance with a phase pattern corresponding to a desired light image,
a position relative to a lattice point of a different refractive index region of the plurality of different refractive index regions is individually set in accordance with the desired light image, and
a magnitude of at least one of a plurality of in-plane wavenumber vectors in reciprocal lattice space of the phase modulation layer is made smaller than 2π/λ, wherein λ is an emission wavelength of the active layer.

### Claim 2 (depends on 1)

The three-dimensional measurement device according to claim 1, further comprising:
a single light source unit; and
a plurality of the image capture units,
wherein the predetermined pattern of the measurement light is a periodic pattern consisting of any of a dot pattern, a stripe pattern, and a lattice pattern, and
the measurement unit measures the three-dimensional shape of the object to be measured on the basis of an active stereo method using the periodic pattern.

### Claim 3 (depends on 1)

The three-dimensional measurement device according to claim 1, further comprising:
a single light source unit; and
a plurality of the image capture units,
wherein the predetermined pattern of the measurement light is a random dot pattern, and
the measurement unit measures the three-dimensional shape of the object to be measured on the basis of an active stereo method using the random dot pattern.

### Claim 4 (depends on 1)

The three-dimensional measurement device according to claim 1, further comprising:
a single light source unit; and
a plurality of the image capture units,
wherein the predetermined pattern of the measurement light is a pattern having a uniform density, and
the measurement unit measures the three-dimensional shape of the object to be measured on the basis of an active stereo method using the pattern having a uniform density.

### Claim 5 (depends on 1)

The three-dimensional measurement device according to claim 1, further comprising:
a plurality of the light source units; and
a single image capture unit,
wherein the predetermined pattern of the measurement light is a gray code pattern, and
the measurement unit measures the three-dimensional shape of the object to be measured on the basis of a triangulation method using the gray code pattern.

### Claim 6 (depends on 1)

The three-dimensional measurement device according to claim 1, further comprising:
a plurality of the light source units; and
a single image capture unit,
wherein the predetermined pattern of the measurement light is a sinusoidal stripe pattern, and
the measurement unit measures the three-dimensional shape of the object to be measured on the basis of a phase shift method using the sinusoidal stripe pattern.

### Claim 7 (depends on 6)

The three-dimensional measurement device according to claim 6, wherein the plurality of light source units output sinusoidal stripe patterns having different periods from each other.

### Claim 8 (depends on 1)

The three-dimensional measurement device according to claim 1, further comprising:
a plurality of the light source units; and
a single image capture unit,
wherein the predetermined pattern of the measurement light is a sinusoidal stripe pattern, and
the measurement unit measures the three-dimensional shape of the object to be measured on the basis of a sampling moire method using the sinusoidal stripe pattern.

### Claim 9 (depends on 1)

The three-dimensional measurement device according to claim 1, further comprising:
a plurality of the light source units; and
a single image capture unit,
wherein the predetermined pattern of the measurement light is a superimposition pattern obtained by superimposing a sinusoidal stripe pattern on a random dot pattern, and
the measurement unit measures the three-dimensional shape of the object to be measured on the basis of a phase shift method using the superimposition pattern.

### Claim 10 (depends on 1)

The three-dimensional measurement device according to claim 1, further comprising:
a plurality of the light source units; and
a single image capture unit,
wherein the predetermined pattern of the measurement light includes a sinusoidal stripe pattern and a gray code pattern, and
the measurement unit measures the three-dimensional shape of the object to be measured on the basis of a phase shift method using the sinusoidal stripe pattern and a triangulation method using the gray code pattern.

### Claim 11 (depends on 1)

The three-dimensional measurement device according to claim 1, further comprising:
a plurality of the light source units; and
a plurality of the image capture units,
wherein the predetermined pattern of the measurement light is a sinusoidal stripe pattern, and
the measurement unit measures the three-dimensional shape of the object to be measured on the basis of a phase shift method and an active stereo method using the sinusoidal stripe pattern.

### Claim 12 (depends on 1)

The three-dimensional measurement device according to claim 1, wherein the light source units and the image capture units are disposed on a surface of a three-dimensional object.