Electronic device testing apparatus and electronic device testing method

An electronic device testing apparatus, comprising:

• a feeding zone, for loading at least one electronic device to be tested;
• a test zone, including a pressing head and a test socket, the pressing head including a suction nozzle for picking or placing the at least one electronic device to be tested, the test socket being used for accommodating and testing the at least one electronic device to be test;
• a discharging zone, for loading at least one tested electronic device;
• an input carrier, for transferring the at least one electronic device to be tested into the test zone;
• an output carrier, for transferring the at least one tested electronic device from the test zone;
• a pick-and-place device, for transferring the at least one electronic device to be tested between the feeding zone and the input carrier, and for transferring the at least one tested electronic device between the output carrier and the discharging zone;
• a housing;
• an empty tray storage zone, an empty tray buffer zone, an empty tray transferring device and an empty tray conveying device;
• wherein the empty tray storage zone is arranged outside the housing:
• the empty tray transferring device is used for transferring an empty tray from the feeding zone to the empty tray buffer zone, and the empty tray conveying device is used for transferring the empty tray from the empty tray buffer zone to the empty tray storage zone;
• wherein after the at least one electronic device to be tested is tested in the test zone and becomes the at least one tested electronic device, the suction nozzle of the pressing head picks up the at least one tested electronic device from the test socket, the output carrier moves into the test zone, the suction nozzle of the pressing head places the at least one tested electronic device on the output carrier, the output carrier moves out of the test zone, and the input carrier follows immediately after the output carrier and successively moves into the test zone at the same speed;
• after the suction nozzle of the pressing head picks up the at least one electronic device to be tested from the input carrier, the input carrier moves out of the test zone, and the suction nozzle of the pressing head places the at least one electronic device to be tested in the test socket.