Apparatus and method of calibrating of a force sensing device by establishing an optimized force-resistance curve
AssigneePeratech IP Ltd
InventorTimothy Peter Wiles
Life of this patent
Estimating the term…
Abstract
A method of calibrating a force sensing device comprises establishing an optimized force-resistance curve by obtaining a mean resistance of a plurality of force-resistance curves for a set of substantially similar force sensing devices and measuring calibration data of the force sensing device. The method applies a plurality of calibration points defined from the measuring step to the optimized force-resistance curve and adapts the optimized force-resistance curve to form an adapted force-resistance curve by interpolating the plurality of calibration points and determining a multiplier value for each calibration point.
Claims15
A method of calibrating a force sensing device, comprising the steps of:
- measuring first calibration data for a set of substantially similar force sensing devices;
- deriving a plurality of force-resistance curves from said first calibration data, each one of said plurality of force-resistance curves corresponding to one force sensing device in said set of substantially similar force sensing devices;
- establishing an optimized force-resistance curve by obtaining a mean resistance of said plurality of force-resistance curves;
- measuring second calibration data of said force sensing device;
- defining a plurality of calibration points from said second calibration data;
- applying said plurality of calibration points to said optimized force-resistance curve;
- adapting said optimized force-resistance curve to form an adapted force-resistance curve by interpolating said plurality of calibration points and determining a multiplier value for each calibration point of said plurality of calibration points;
- and
- calibrating said force sensing device from said adapted force-resistance curve.
Apparatus for measuring a mechanical interaction, comprising:
- a force sensing device comprising a first conductive layer, a second conductive layer, and a pressure sensitive layer between said first conductive layer and said second conductive layer;
- and
- a processor configured to:
- measure first calibration data for a set of substantially similar force sensing devices;
- derive a plurality of force-resistance curves from said first calibration data, each one of said plurality of force-resistance curves corresponding to one force sensing device in said set of substantially similar force sensing devices;
- establish an optimized force-resistance curve by obtaining a mean resistance of said plurality of force-resistance curves;
- measure second calibration data of said force sensing device;
- define a plurality of calibration points from said second calibration data;
- apply said plurality of calibration points to said optimized force-resistance curve;
- adapt said optimized force-resistance curve to form an adapted force-resistance curve by interpolating said plurality of calibration points and determining a multiplier value for each calibration point of said plurality of calibration points;
- and
- calibrate said force sensing device from said adapted force-resistance curve.
Dependencies are inferred from the claim text.