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US 12,153,068 B2Granted
Atomic-force microscopy for identification of surfaces
AssigneeTrustees of Tufts College
InventorsIgor Sokolov, Milos Miljkovic
Life of this patent
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Abstract
A method comprises using an atomic-force microscope, acquiring a set of images associated with surfaces, and, using a machine-learning algorithm applied to the images, classifying the surfaces. As a particular example, the classification can be done in a way that relies on surface parameters derived from the images rather than using the images directly.
Claims11
An apparatus for detecting bladder cancer in a patient, the apparatus comprising:
- an atomic force microscope comprising a probe, wherein the probe is configured to scan a first surface of a first bladder cell and
- a processing system configured to acquire a first image of the first surface from the atomic force microscope, to compare the first image to a second image, the second image being that of a second surface of a second bladder cell, the second bladder cell being a bladder-cancer cell, and to classify the first bladder cell as also being a bladder-cancer cell.
Dependencies are inferred from the claim text.