US 12,146,914 B2 · Bit error ratio estimation using machine learning

Abstract

A test and measurement system includes a machine learning system, a test and measurement device including a port configured to connect the test and measurement device to a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: acquire a waveform from the device under test (DUT), transform the waveform into a composite waveform image, and send the composite waveform image to the machine learning system to obtain a bit error ratio (BER) value for the DUT. A method of determining a bit error ratio for a device under test (DUT), includes acquiring one or more waveforms from the DUT, transforming the one or more waveforms into a composite waveform image, and sending the composite waveform image to a machine learning system to obtain a bit error ratio (BER) value for the DUT.

Claims19

Dependent claims

A test and measurement system, comprising:

a machine learning system;
a test and measurement device including a port configured to connect the test and measurement device to a device under test (DUT);
and
one or more processors, and a memory for storing code, which when executed by the one or more processors, causes the one or more processors to:
acquire one or more waveforms from the DUT by capturing one or more signals from the DUT and generating the one or more waveforms from the one or more signals;
transform the one or more waveforms into a composite waveform image, the composite waveform image based on at least two images from the one or more waveforms;
and
send the composite waveform image to the machine learning system to obtain a bit error ratio (BER) value for the DUT.

5 more elements

Dependencies are inferred from the claim text.

Bit error ratio estimation using machine learning

Life of this patent

Bit error ratio estimation using machine learning

Life of this patent

Abstract

Claims19