Test system, test method, and non-transitory computer readable medium
AssigneeKioxia Corporation
InventorKazuhiko Nakahara
Life of this patent
Estimating the term…
Abstract
According to a certain embodiment, the test system includes a first test board, a test executable integrated circuit, and a first measuring apparatus. A device under test (DUT) is mounted on the first test board. The test executable integrated circuit is mounted on the first test board, and is configured to read firmware stored in the DUT in advance and to test the DUT. The first measuring apparatus instructs the test executable integrated circuit to start a test of the DUT. There are provided the test system, the test method, and the non-transitory computer readable medium, capable of reducing costs required for tests and also of shortening test time.
Claims18
A test system comprising:
- a second test board on which a device under test is mounted;
- a second measuring apparatus connected to the device under test and configured to write firmware to the device under test mounted on the second test board, the device under test being removable from the second test board after the firmware is written to the device under test;
- a first test board on which the device under test removed from the second test board after the firmware is written is then mounted, the first test board being a different test board from the second test board;
- a test executable integrated circuit mounted on the first test board, the test executable integrated circuit configured to read the firmware stored in advance in the device under test and to execute a test of the device under test mounted on the first test board in accordance with the firmware;
- and
- a first measuring apparatus configured to instruct to start the test of the device under test to the test executable integrated circuit, the first measuring apparatus being a different measuring apparatus from the second measuring apparatus.
A test method comprising:
- mounting a device under test on a second test board;
- writing firmware to the device under test mounted on the second test board using a second measuring apparatus connected to the device under test;
- removing the device under test from the second test board after the firmware is written;
- mounting the device under test, removed from the second test board after the firmware is written, on a first test board on which a test executable integrated circuit is mounted, the first test board being a different test board from the second test board;
- reading, by the test executable integrated circuit, firmware stored in advance in the device under test mounted on the first test board;
- instructing, by the first measuring apparatus, the test executable integrated circuit to start a test of the device under test mounted on the first test board, the first measuring apparatus being a different measuring apparatus from the second measuring apparatus;
- testing, by the test executable integrated circuit in accordance with the firmware, the device under test mounted on the first test board;
- and
- writing, by the test executable integrated circuit, a test result to the device under test mounted on the first test board.
A non-transitory computer readable medium in which a computer program is stored, the computer program being executed by a computer used for a test system for conducting a test for a device under test, the computer program comprising:
- mounting a device under test on a second test board;
- and
- writing firmware to the device under test mounted on the second test board using a second measuring apparatus connected to the device under test;
- removing the device under test from the second test board after the firmware is written;
- mounting the device under test, removed from the second test board after the firmware is written, on a first test board on which a test executable integrated circuit is mounted, the first test board being a different test board from the second test board;
- reading, by the test executable integrated circuit, firmware stored in advance in the device under test mounted on the first test board;
- instructing, by the first measuring apparatus, the test executable integrated circuit to start a test of the device under test mounted on the first test board, the first measuring apparatus being a different measuring apparatus from the second measuring apparatus;
- testing, by the test executable integrated circuit in accordance with the firmware, the device under test mounted on the first test board;
- and
- writing, by the test executable integrated circuit, a test result to the device under test mounted on the first test board.
Dependencies are inferred from the claim text.