Method of finding optimized analog measurement hardware settings as well as method of measuring a device under test

A method of measuring a device under test, the method comprising:

• finding optimized analog measurement hardware settings of a measurement system for a target measurement, wherein said finding optimized analog measurement hardware settings includes:
• applying initial settings to the measurement system;
• varying the settings over a power sweep while processing a test signal used for the target measurement or a representative signal;
• performing the target measurement during the power sweep, thereby determining a hardware contribution of the measurement system over the power sweep;
• and
• identifying the respective settings that lead to a minimum hardware contribution of the measurement system at various powers;
• performing a power measurement of the device under test, wherein the power measurement of the device under test reveals an output power of the device under test;
• thereafter
• applying said identified settings for at least one specific power level, wherein said identified settings are applied that match with the output power of the device under test.