Back to results
US 12,135,299 B2Granted
X-ray fluorescence analyzer
AssigneeShimadzu Corporation
InventorsTakuro Izumi, Tetsuya Yoneda
Life of this patent
Estimating the term…
Abstract
An X-ray fluorescence analyzer is provided inside an analysis chamber covered with a housing with: an X-ray tube; an analyzing crystal for spectrally dispersing X-ray fluorescence emitted from a sample; an X-ray detector for detecting the X-ray fluorescence spectrally dispersed by the analyzing crystal; a warm air generator for generating warm air to maintain a temperature of the analyzing crystal at a target temperature; and a Peltier element for cooling the X-ray detector.
Claims3
An X-ray fluorescence analyzer comprising:
- an analyzing crystal configured to spectrally disperse X-ray fluorescence emitted from a sample;
- an X-ray detector configured to detect the X-ray fluorescence spectrally dispersed by the analyzing crystal;
- a warm air generator configured to generate warm air to maintain a temperature of the analyzing crystal at a target temperature;
- and
- a Peltier element configured to cool the X-ray detector such that a temperature of the X-ray detector is set to a temperature lower than the target temperature,
- wherein the Peltier element includes:
- a heat absorption portion configured to absorb heat of the X-ray detector to cool the X-ray detector;
- and
- a heat dissipation portion configured to dissipate heat of the heat absorption portion to an outside, the heat dissipation portion being provided on a side farther from the X-ray detector than the heat absorption portion,
- wherein the X-ray fluorescence analyzer further comprises a heat sink in contact with the heat dissipation portion of the Peltier element, and
- wherein the warm air generator is arranged such that the warm air sent from the warm air generator is brought into contact with the heat sink.
8 more elements
Dependencies are inferred from the claim text.