Delay time detection circuit, stamping information generation device, and delay time detection method
AssigneeNEC Platforms, Ltd.
InventorMasayuki Takahashi
Life of this patent
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AssigneeNEC Platforms, Ltd.
InventorMasayuki Takahashi
Estimating the term…
A delay time detection circuit includes below configurations. A clock generation unit generates a sub scale clock signal, based on a system clock signal. A count unit generates a count signal while sequentially and repeatedly incrementing a count number, based on the sub scale clock signal. A sub scale signal generation unit receives the count signal, and generates sub scale signals, equal in number to the count number, that each have, at a rate of once in the count number, a rectangular wave for a duration being associated with a second period and that are shifted in timing relative to one another according to the second period. A delay time calculation unit receives the input clock signal, and calculates a delay time within a range of the first period of the input clock signal with respect to the system clock signal, based on one of the sub scale signals.
A delay time detection circuit that detects a delay time of an input clock signal having a first period with respect to a system clock signal by use of the system clock signal corresponding to a main scale and having the first period, and a sub scale clock signal corresponding to a sub scale and having a second period differing from the first period, the delay time detection circuit comprising:
A delay time detection method comprising:
Dependencies are inferred from the claim text.