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US 12,127,325 B2Granted
Systems, devices, and methods for secondary particle suppression from a charge exchange device
AssigneeTae Technologies, Inc.
InventorsArtem N. Smirnov, Vladislav Vekselman, Vladimir I. Davydenko, Alexandr A. Ivanov, Michael Meekins, Blake Koop, Jr.
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Abstract
Embodiments of systems, devices, and methods relating to a charge exchange system having one or more guard apparatuses are described. The guard apparatuses can include one or more guard electrodes, optionally with one or more screen electrodes. Also described are embodiments of beam systems incorporating one or more charge exchange systems.
Claims14
A system, comprising:
- a charge exchange device having an inlet, a lumen fillable with a gas adapted to convert an incoming negative particle beam to a positive particle beam, and an outlet;
- and
- an aperture structure located in close proximity with the inlet, wherein the aperture structure has an annular shape with an inner aperture sized to permit passage of the incoming negative particle beam when in an aligned state, and wherein the aperture structure is configured to at least partially shield the charge exchange device when the incoming negative particle beam is in a misaligned state.
A neutron beam system comprising:
- a tandem accelerator comprising:
- a plurality of input electrodes adapted to be sequentially increasingly positively biased to accelerate a negative beam from an inlet;
- a charge exchange device having a lumen fillable with a gas adapted to convert the negative beam to a positive beam;
- a plurality of output electrodes adapted to be sequentially decreasingly positively biased to accelerate the positive beam from the charge exchange device to an outlet;
- and
- an aperture structure located in close proximity with the inlet, wherein the aperture structure has an annular shape with an inner aperture sized to permit passage of the negative beam when in an aligned state, and wherein the aperture structure is configured to at least partially shield the charge exchange device when the negative beam is in a misaligned state;
- a high-energy beamline coupled to the outlet of the tandem accelerator;
- and
- a low-energy beamline (LEBL) coupled to the inlet of the tandem accelerator.
6 more elements
A method comprising:
- forming a negative particle beam;
- applying the negative particle beam to a charge exchange device while an aperture structure adjacent the charge exchange device is biased, wherein the charge exchange device converts the negative particle beam to a positive particle beam;
- and
- measuring current through the aperture structure.
1 more element
Dependencies are inferred from the claim text.