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OwnerChuanlin Li, Fulin Li +1inventors
InventorsChuanlin Li, Fulin Li, Haixiang Wang
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The present disclosure relates to the field of biometric parameter measurement, and in particular, to a temperature measurement circuit, a temperature measurement method, a temperature and light intensity measurement circuit, a temperature and light intensity measurement method, a chip, a module, and an electronic device. A temperature signal is obtained based on an output voltage of a differential amplifier circuit when a non-inverting input terminal of the differential amplifier circuit is unload, an output voltage of the differential amplifier circuit when the non-inverting input terminal of the differential amplifier circuit is connected to a calibration resistor, and the output voltage of the differential amplifier circuit when the non-inverting input terminal of the differential amplifier circuit is connected to a thermistor, which improves the accuracy of the temperature measurement.
A temperature measurement circuit, comprising:
A chip comprising a temperature measurement circuit, wherein the temperature measurement circuit comprising:
An electronic device comprising a housing, a thermistor, a calibration resistor and a chip disposed in the housing, wherein the thermistor is configured to convert a temperature signal of a measured object to a resistance signal, wherein the chip comprising a temperature measurement circuit, wherein the temperature measurement circuit comprises:
Dependencies are inferred from the claim text.