# US 12,118,288 B2 · Method for configuring sub route flow, storage medium, and equipment

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- Number: US 12,118,288 B2
- Document ID: US12118288B2
- Status: Granted
- Kind: B2
- Application number: 17/502,867
- Filed: 2021-10-15
- Published: 2023-01-26
- Granted: 2024-10-15
- Earliest claimed: 2021-07-19
- Assignees: Changxin Memory Technologies, Inc.
- Applicants: Changxin Memory Technologies, Inc.
- Inventors: Ai Nie; Ying Xu
- Web page: https://patentgrep.com/patent/US12118288B2

## CPC

- G06F 30/398: Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM] (optical proximity correction [OPC] design processes G03F1/36)
- G01R 31/2834: {Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736)}
- G06F 30/394: Routing (G06F30/396 takes precedence)
- G01R 31/31903: {tester configuration}
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

A sub route flow is a route flow different from a main route flow in testing of a semiconductor product. A method for configuring a sub route flow includes: determining at least one test item of the semiconductor product; obtaining a first test template corresponding to the test item, wherein the first test template includes preset test parameters; displaying the preset test parameters; receiving test parameters adjusted according to the preset test parameters; configuring current test parameters of the test item according to the adjusted test parameters; and forming the sub route flow of the semiconductor product according to the current test parameters of the test item.

## Claims

### Claim 1

A method for configuring a sub route flow, the sub route flow being a route flow different from a main route flow in testing of a semiconductor product, comprising:
determining at least one test item of the semiconductor product;
obtaining a first test template corresponding to the test item, wherein the first test template includes preset test parameters;
displaying the preset test parameters;
receiving test parameters adjusted according to the preset test parameters;
configuring current test parameters of the test item according to the adjusted test parameters; and
forming the sub route flow of the semiconductor product according to the current test parameters of the test item.

### Claim 2 (depends on 1)

The method for configuring a sub route flow according to claim 1, wherein the test item determined by the sub route flow is the same with a preset test item in the main route flow, or the test item determined by the sub route flow is different from the preset test item in the main route flow.

### Claim 3 (depends on 1)

The method for configuring a sub route flow according to claim 1, wherein a cut-in position and a cut-out position of the sub route flow are configured as same or different positions in the main route flow.

### Claim 4 (depends on 1)

The method for configuring a sub route flow according to claim 1, wherein a cut-in position and a cut-out position of the sub route flow are configured in one of following ways:
the cut-in position of the sub route flow is before an nth preset test item in the main route flow, and the cut-out position is before or after an (n+m)th preset test item in the main route flow;
alternatively,
the cut-in position of the sub route flow is after the nth preset test item in the main route flow, and the cut-out position is after the (n+m)th preset test item in the main route flow;
wherein, the n is an integer greater than or equal to 1, and the m is an integer greater than or equal to 0.

### Claim 5 (depends on 1)

The method for configuring a sub route flow according to claim 1, further comprising:
generating a second test template according to the current test parameters of the test item;
determining whether test parameters in the second test template are the same as test parameters in a stored test template; and
if not, storing the second test template.

### Claim 6 (depends on 5)

The method for generating a sub route flow according to claim 5, further comprising:
generating related information of the second test template.

### Claim 7 (depends on 6)

The method for configuring a sub route flow according to claim 6, wherein the generating related information of the second test template comprises one or more of the following:
information related to identification of the sub route flow;
information related to measurement of the sub route flow;
information related to the test item in the sub route flow;
information related to user selection in the sub route flow; and
information related to the main route flow.

### Claim 8 (depends on 1)

The method for configuring a sub route flow according to claim 1, further comprising:
determining, according to a type of the semiconductor product and the test item, the first test template meeting test requirements of the type of the semiconductor product.

### Claim 9 (depends on 1)

The method for configuring a sub route flow according to claim 1, wherein when there are a plurality of the test items, the displaying the preset test parameters comprises:
sequentially displaying the preset test parameters corresponding to each of the test items according to a sequence of the test items in the sub route flow of the semiconductor product;
the configuring current test parameters of the test item according to the adjusted test parameters comprises:
sequentially configuring the current test parameters corresponding to each of the test items according to the adjusted test parameters of each of the test items.

### Claim 10 (depends on 9)

The method for configuring a sub route flow according to claim 9, wherein the plurality of the test items are the same or different.

### Claim 11 (depends on 1)

The method for configuring a sub route flow according to claim 1, further comprising:
creating a test template according to the test item and the test parameters of the test item; and
storing the test template.

### Claim 12 (depends on 1)

The method for configuring a sub route flow according to claim 1, wherein the test parameters comprise a test environment related test parameter, a semiconductor product related test parameter, and/or a semiconductor product test device related parameter.

### Claim 13 (depends on 1)

A non-temporary computer readable storage medium, storing a computer program therein, wherein when the computer program is executed, steps of the method according to claim 1 are implemented.

### Claim 14 (depends on 1)

A computer equipment, comprising a processor, a memory, and a computer program stored in the memory, wherein when the processor executes the computer program, steps of the method according to claim 1 are implemented.