Spectrometer

A spectrometer configured to generate pre-diffraction radiation light generated from a test sample in front of a diffraction grating, to allow the pre-diffraction radiation light to be transmitted or reflected through the diffraction grating, to generate post-diffraction radiation light at a rear of the diffraction grating, and to analyze the test sample through the post-diffraction radiation light, the spectrometer comprising:

• a slit unit and a collimating member sequentially arranged along a path of the pre-diffraction radiation light;
• a focusing member and a detection unit sequentially arranged along a path of the post-diffraction radiation light;
• and
• the diffraction grating located between the collimating member and the focusing member, wherein
• the slit unit, the collimating member, the diffraction grating, and the focusing member are seated in one plane and are spaced apart from each other by a predetermined distance,
• the diffraction grating is formed in a shape of a polygonal plate erected between the pre-diffraction radiation light and the post-diffraction radiation light in the one plane,
• the detection unit is spaced apart from the one plane, is located above the diffraction grating, and covers the diffraction grating along an uppermost surface of the diffraction grating when viewed from above the detection unit, and
• wherein the slit unit and the diffraction grating are spaced apart from the collimating member by the same focal length.

A spectrometer configured to generate pre-diffraction radiation light generated from a test sample in front of a diffraction grating, to allow the pre-diffraction radiation light to be transmitted or reflected through the diffraction grating, to generate post-diffraction radiation light at a rear of the diffraction grating, and to analyze the test sample through the post-diffraction radiation light, the spectrometer comprising:

• a slit unit and a collimating member sequentially arranged along a path of the pre-diffraction radiation light;
• a focusing member and a detection unit sequentially arranged along a path of the post-diffraction radiation light;
• and
• the diffraction grating located between the collimating member and the focusing member, wherein
• the slit unit, the collimating member, the diffraction grating, and the focusing member are seated in one plane and are spaced apart from each other by a predetermined distance,
• the diffraction grating is formed in a shape of a polygonal plate erected between the pre-diffraction radiation light and the post-diffraction radiation light in the one plane,
• the detection unit is spaced apart from the one plane, is located above the diffraction grating, and covers the diffraction grating along an uppermost surface of the diffraction grating when viewed from above the detection unit, and
• wherein
• when the detection unit comprises:
• a photoelectric device located in a predetermined region of the detection unit;
• a plurality of pixels constituting the photoelectric device;
• and
• a photodiode provided at each of the plurality of pixels,
• each pixel receives light of a specific wavelength from the post-diffraction radiation light.