# US 12,112,917 B2 · Sample holder and charged particle beam system

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- Number: US 12,112,917 B2
- Document ID: US12112917B2
- Status: Granted
- Kind: B2
- Application number: 17/570,802
- Filed: 2022-01-07
- Published: 2022-07-14
- Granted: 2024-10-08
- Earliest claimed: 2021-01-08
- Assignees: JEOL Ltd.
- Applicants: JEOL Ltd.
- Inventors: Shuichi Yuasa
- Web page: https://patentgrep.com/patent/US12112917B2

## CPC

- H01J 37/20: Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
- H01J 2237/184: Vacuum locks
- H01J 2237/2007: Holding mechanisms
- H01J 2237/20207: Tilt
- H01J 2237/204: Means for introducing and/or outputting objects
- H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H)

## Abstract

There is provided a sample holder which is for use in a charged particle beam system and which can prevent damage to a sample stage during transportation of a cartridge. The sample holder includes: the cartridge having the sample stage for holding a sample therein; and a holder base having a mounting portion to which the cartridge can be mounted. The cartridge has: a tilt mechanism for tilting the sample stage; and a lock lever which, when the cartridge has been taken out from the mounting portion, makes contact with the sample stage and limits tilt of the stage.

## Claims

### Claim 1

A sample holder for use in a charged particle beam system, said sample holder comprising:
a cartridge having a sample stage for holding a sample therein;
a holder base having a mounting portion to which the cartridge can be mounted; and
wherein the cartridge has: a tilt mechanism for tilting the sample stage; and a lock lever which, when the cartridge has been detached from the mounting portion, makes contact with the sample stage and limits tilt of the sample stage;
a resilient member connected to said lock lever;
wherein, when said cartridge has been taken out from said mounting portion, the lock lever is biased into contact with said sample stage by the resilient member; and
wherein, when the cartridge has been mounted to the mounting portion, the lock lever strikes on a block mounted on the mounting portion and moves away from the sample stage.

### Claim 2 (depends on 1)

A charged particle beam system comprising a sample holder as set forth in claim 1.

### Claim 3 (depends on 2)

The charged particle beam system as set forth in claim 2, further comprising:
a sample chamber in which said mounting portion of said sample holder is disposed;
a sample exchange chamber connected into the sample chamber; and
a transport rod for transporting said cartridge between the sample chamber and the sample exchange chamber.

### Claim 4

A sample holder for use in a charged particle beam system, said sample holder comprising:
a cartridge having a sample stage for holding a sample therein; and
a holder base having a mounting portion to which the cartridge can be mounted;
wherein the cartridge has: a tilt mechanism for tilting the sample stage; and a lock lever which, when the cartridge has been detached from the mounting portion, makes contact with the sample stage and limits tilt of the sample stage, and
wherein said tilt mechanism has:
a tilt arm connected to said sample stage; and
a tilt lever connected to the tilt arm;
wherein said holder base has a shaft which, when said cartridge has been mounted to said mounting portion, makes contact with the tilt lever to thereby tilt the sample stage, whereby the sample stage and said lock lever move away from each other.

### Claim 5 (depends on 4)

A charged particle beam system comprising a sample holder as set forth in claim 4.

### Claim 6 (depends on 5)

The charged particle beam system as set forth in claim 5, further comprising:
a sample chamber in which said mounting portion of said sample holder is disposed;
a sample exchange chamber connected into the sample chamber; and
a transport rod for transporting said cartridge between the sample chamber and the sample exchange chamber.