# US 12,112,815 B2 · Method and apparatus for batch testing device, related computer device and medium > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,112,815 B2 - Document ID: US12112815B2 - Status: Granted - Kind: B2 - Application number: 17/451,337 - Filed: 2021-10-19 - Published: 2022-08-25 - Granted: 2024-10-08 - Earliest claimed: 2021-02-23 - Assignees: Changxin Memory Technologies, Inc. - Applicants: Changxin Memory Technologies, Inc. - Inventors: Wei Yang; Fang Tian - Web page: https://patentgrep.com/patent/US12112815B2 ## CPC - G11C 29/08: Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing - G11C 29/56: External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor - G06F 11/263: Generation of test inputs, e.g. test vectors, patterns or sequences {; with adaptation of the tested hardware for testability with external testers} - G11C: STATIC STORES (semiconductor memory devices H10B) - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) ## Abstract The present application relates to a method and apparatus for batch testing device, related a computer device and a medium. The method includes: writing a corresponding test identification into each of the devices to be tested, wherein different devices to be tested have different test identifications; acquiring a device identification of each of the devices to be tested and generating a device identification sequence; sending corresponding test cases to the devices to be tested sequentially according to the device identification sequence, so that each of the devices to be tested executes the corresponding test case; and generating a test result for each of the devices to be tested, the test result corresponding to the corresponding test identification. ## Claims ### Claim 1 A method for a batch testing device, for batch testing of a plurality of devices to be tested, the method comprising: writing a corresponding test identification into each of the devices to be tested, wherein different devices of the devices to be tested have different test identifications; acquiring a device identification of each of the devices to be tested and generating a device identification sequence; sending corresponding test cases to the devices to be tested sequentially according to the device identification sequence, so that each of the devices to be tested executes the corresponding test case; and generating a test result for each of the devices to be tested, the test result corresponding to the corresponding test identification, which comprises: acquiring test results in one-to-one correspondence to the device identification sequence and acquiring the test identifications in one-to-one correspondence to the device identification sequence; and sequentially generating, from the test results of the devices to be tested according to the device identification sequence, identification test result files named after identification names, the identification names comprising the corresponding test identifications, so as to establish a mapping relationship between the test results of the devices to be tested and the corresponding test identifications. ### Claim 2 (depends on 1) The method according to claim 1, further comprising: prior to the writing a corresponding test identification into each of the devices to be tested, acquiring the corresponding test identification of each of the devices to be tested. ### Claim 3 (depends on 2) The method according to claim 2, wherein the corresponding test identification is a user-defined test identification. ### Claim 4 (depends on 1) The method according to claim 1, wherein the acquiring a device identification of each of the devices to be tested and generating a device identification sequence comprises: acquiring attribute data of each of the devices to be tested and storing the attribute data to a first preset file; and acquiring, by using a corresponding parsing rule according to the first preset file, a second preset file having the device identification sequence of each of the devices to be tested. ### Claim 5 (depends on 4) The method according to claim 4, wherein the sending corresponding test cases to the devices to be tested sequentially according to the device identification sequence comprises: sending the corresponding test cases to the devices to be tested sequentially according to the device identification sequence in the second preset file. ### Claim 6 (depends on 1) The method according to claim 1, further comprising: after the generating, from the test results of the devices to be tested according to the device identification sequence, identification test result files named after identification names, outputting the test result for each of the devices to be tested in a predetermined format. ### Claim 7 (depends on 6) The method according to claim 6, wherein the outputting the test result for each of the devices to be tested in a predetermined format comprises: outputting a test result folder, the test result folder comprising the identification test result files of the devices to be tested. ### Claim 8 (depends on 1) The method according to claim 1, wherein the corresponding test cases are compiled according to test requirements under a same batch test automation framework. ### Claim 9 (depends on 1) The method according to claim 1, wherein the devices to be tested comprise a memory chip. ### Claim 10 (depends on 9) The method according to claim 9, wherein the memory chip comprises a dynamic random access memory chip. ### Claim 11 (depends on 1) The method according to claim 1, wherein at least two of the devices to be tested correspond to different test cases. ### Claim 12 (depends on 1) A computer device, comprising a memory and a processor, the memory storing a computer program runnable on the processor, wherein steps of the method according to claim 1 are implemented when the processor executes the computer program.