# US 12,112,803 B2 · Memory device and programming method thereof

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- Number: US 12,112,803 B2
- Document ID: US12112803B2
- Status: Granted
- Kind: B2
- Application number: 18/090,499
- Filed: 2022-12-29
- Published: 2024-07-04
- Granted: 2024-10-08
- Earliest claimed: 2022-12-29
- Assignees: Macronix International Co., Ltd.
- Applicants: MACRONIX International Co., Ltd.
- Inventors: Ya-Jui Lee; Kuan-Fu Chen
- Web page: https://patentgrep.com/patent/US12112803B2

## CPC

- G11C 16/08: Address circuits; Decoders; Word-line control circuits
- G11C 16/10: Programming or data input circuits
- G11C 11/5628: {Programming or writing circuits; Data input circuits}
- G11C 16/0483: {comprising cells having several storage transistors connected in series}
- G11C 16/28: using differential sensing or reference cells, e.g. dummy cells
- G11C: STATIC STORES (semiconductor memory devices H10B)

## Abstract

A memory device and programming method thereof are provided. A memory cell array includes a first dummy word line set, plural word lines and a second dummy word line set in sequence. The method includes: grouping the word lines into word line groups; generating at least one pass bias set having plural pass biases that are respectively corresponding to each word line group; selecting one word line for programming, and determining that the selected word line belongs to a specific word line group; and according to a programming sequence, applying a corresponding pass bias in the plural pass biases of the at least one pass bias set to at least one dummy word line in one of the first and the second dummy word line sets, wherein the corresponding pass bias corresponds to the specific word line group.

## Claims

### Claim 1

A programming method for a memory device, wherein the memory device has a memory cell array that includes a first dummy word line set, a plurality of word lines and a second dummy word line set arranged in sequence, the programming method comprising:
grouping the plurality of word lines into a plurality of word line groups;
generating at least one pass bias set, the at least one pass bias set having a plurality of pass biases that are respectively corresponding to each of the plurality of word line groups;
selecting one of the plurality of word lines for programming, and determining that the selected word line belongs to a specific word line group of the plurality of word line groups; and
according to a programming sequence, applying a corresponding pass bias in the plurality of pass biases of the at least one pass bias set to at least one dummy word line in one of the first dummy word line set and the second dummy word line set, wherein the corresponding pass bias corresponds to the specific word line group.

### Claim 2 (depends on 1)

The programming method according to claim 1, wherein when the programming sequence is a side of the first dummy word line set to a side of the second dummy word line side, the at least one pass bias set is applied to the at least one dummy word line of the second dummy word line set.

### Claim 3 (depends on 2)

The programming method according to claim 2, wherein, the closer the specific word line group of the plurality of word line groups is to the second dummy word line set, the corresponding pass bias in the plurality of pass biases is higher.

### Claim 4 (depends on 2)

The programming method according to claim 2, wherein a fixed pass bias is applied to dummy word lines other than the at least one dummy word line of the second dummy word line set.

### Claim 5 (depends on 2)

The programming method of a memory device according to claim 2, wherein an another dummy word line other than the at least one dummy word line of the second dummy word line set is applied with an another pass bias set.

### Claim 6 (depends on 1)

The programming method according to claim 1, wherein numbers of word lines in each of the plurality of word line groups are equal or different.

### Claim 7 (depends on 1)

The programming method according to claim 1, wherein the plurality of pass biases in the at least one pass bias set has different values.

### Claim 8 (depends on 1)

The programming method of a memory device according to claim 1, wherein two adjacent pass biases among the plurality of pass biases in the at least one pass bias set are equal.

### Claim 9 (depends on 1)

The programming method according to claim 1, wherein the memory device is a two-dimensional or three-dimensional NAND flash memory.

### Claim 10 (depends on 1)

The programming method according to claim 1, wherein the memory cells of the memory device are single-level cells, double-level cells, triple-level cells or quad-level cells.

### Claim 11

A memory device, comprising:
a memory cell array, including a first dummy word line set, a plurality of word lines and a second dummy word line set arranged in sequence; and
a memory control circuit, controlling the memory cell array,
wherein the memory control circuit further performs a programming operation, comprising:
grouping the plurality of word lines into a plurality of word line groups;
generating at least one pass bias set, the at least one pass bias set having a plurality of pass biases that are respectively corresponding to each of the plurality of word line groups;
selecting one of the plurality of word lines for programming, and determining that the selected word line belongs to a specific word line group of the plurality of word line groups; and
according to a programming sequence, applying a corresponding pass bias in the plurality of pass biases of the at least one pass bias set to at least one dummy word line in one of the first dummy word line set and the second dummy word line set, wherein the corresponding pass bias corresponds to the specific word line group.

### Claim 12 (depends on 11)

The programming method according to claim 11, wherein when the programming sequence is a side of the first dummy word line set to a side of the second dummy word line side, the at least one pass bias set is applied to the at least one dummy word line of the second dummy word line set.

### Claim 13 (depends on 12)

The programming method according to claim 12, wherein, the closer the specific word line group of the plurality of word line groups is to the second dummy word line set, the corresponding pass bias in the plurality of pass biases is higher.

### Claim 14 (depends on 12)

The programming method according to claim 12, wherein a fixed pass bias is applied to dummy word lines other than the at least one dummy word line of the second dummy word line set.

### Claim 15 (depends on 12)

The programming method of a memory device according to claim 12, wherein an another dummy word line other than the at least one dummy word line of the second dummy word line set is applied with an another pass bias set.

### Claim 16 (depends on 11)

The programming method according to claim 11, wherein numbers of word lines in each of the plurality of word line groups are equal or different.

### Claim 17 (depends on 11)

The programming method according to claim 11, wherein the plurality of pass biases in the at least one pass bias set has different values.

### Claim 18 (depends on 11)

The programming method of a memory device according to claim 11, wherein two adjacent pass biases among the plurality of pass biases in the at least one pass bias set are equal.

### Claim 19 (depends on 11)

The programming method according to claim 11, wherein the memory device is a two-dimensional or three-dimensional NAND flash memory.

### Claim 20 (depends on 11)

The programming method according to claim 11, wherein the memory cells of the memory device are single-level cells, double-level cells, triple-level cells or quad-level cells.