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US 12,112,469 B2Granted
Automatic display pixel inspection system and method
AssigneeLG Electronics Inc.
InventorsSeunghwan Seok, Hyohyung Lee, Inbum Yang, Bongwoon Choi
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Abstract
The present invention relates to an automatic display pixel inspection system and method and, particularly, to an automatic inspection system and method for inspecting defects occurring in the process of assembling semiconductor light emitting devices in a fluid.
Claims11
A system for detecting an assembly defect of a semiconductor light emitting device, the system comprising:
- a tank including an outer wall comprising a transparent material to allow inspection of an object located in a fluid inside the tank from outside the tank;
- a lighting device configured to irradiate the object;
- a telecentric lens located outside the tank and configured to condense light reflected from the irradiated object;
- a driver configured to move the telecentric lens along an optical axis of the telecentric lens;
- a controller configured to control the lighting device to sequentially irradiate the object with a red monochromatic light beam, a green monochromatic light beam, and a blue monochromatic light beam in order of respective wavelengths of the red, green and blue monochromatic light beams, based on a predetermined period relative to a predetermined time point, and control the driver to sequentially move the telecentric lens to adjust a distance between the object and the telecentric lens in response to the respective wavelengths of the red, green and blue monochromatic light beams;
- and
- a camera configured to receive the reflected light that has passed through the telecentric lens to acquire a plurality of images of a certain size corresponding to the red, green, and blue monochromatic light beams, respectively,
- wherein the controller is further configured to detect the assembly defect of the semiconductor light emitting device by synthesizing the plurality of images into a color image of three channels.
5 more elements
A method for detecting an assembly defect of a semiconductor light emitting device, the method comprising:
- disposing an object in a fluid inside a tank;
- disposing a telecentric lens at an inspection position outside the tank;
- sequentially irradiating the object with a red monochromatic light beam, a green monochromatic light beam, and a blue monochromatic light beam in order of respective wavelengths of the red, green and blue monochromatic light beams, based on a predetermined period relative to a predetermined time point, to obtain a plurality of images of a certain size respectively corresponding to the red, green, and blue monochromatic light beams;
- synthesizing the plurality of images into a color image of three channels;
- and
- detecting the assembly defect of the semiconductor light emitting device by analyzing the color image of the three channels,
- wherein irradiating the object includes sequentially controlling the telecentric lens to move to adjust a distance between the object and the telecentric lens in response to the respective wavelengths of the red, green and blue monochromatic light beams.
4 more elements
Dependencies are inferred from the claim text.