# US 12,111,753 B2 · Method, apparatus, and storage medium for generating test cases > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,111,753 B2 - Document ID: US12111753B2 - Status: Granted - Kind: B2 - Application number: 17/834,105 - Filed: 2022-06-07 - Published: 2023-02-23 - Granted: 2024-10-08 - Earliest claimed: 2021-08-18 - Assignees: Xepic Corporation Limited - Applicants: Xepic Corporation Limited - Inventors: Wu Huang - Web page: https://patentgrep.com/patent/US12111753B2 ## CPC - G06F 11/3684: {for test design, e.g. generating new test cases} - G06F 11/3676: {for coverage analysis} - G06F 11/3688: {for test execution, e.g. scheduling of test suites} - G06F 11/3692: {for test results analysis} - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) ## Abstract A method for generating test cases. The test cases are used to test a plurality of functional units of a logic system design during a simulation process of the logic system design. The method includes acquiring a constraint for generating test cases, and generating a first set of test cases according to the constraint. The first set of test cases is used to cover a part of the plurality of functional units. The method further includes performing a test on the logic system design based on the first set of test cases, determining uncovered functional units that are not covered by the test and a current coverage of the test, and, in response to the current coverage failing to satisfy a preset test coverage condition, generating a second set of test cases according to the uncovered functional units. ## Claims ### Claim 1 A method for generating test cases, wherein the test cases are used to test a plurality of functional units of a logic system design during a simulation process of the logic system design, the method comprising: acquiring a constraint for generating test cases; generating a first set of test cases according to the constraint, wherein the first set of test cases is used to cover a part of the plurality of functional units; performing a test on the logic system design based on the first set of test cases to obtain a test result; based on the test result, determining uncovered functional units that are not covered by the test and a current coverage of the test; and after the current coverage of the test is determined based on the test result, in response to the current coverage failing to satisfy a preset test coverage condition, generating a second set of test cases according to the uncovered functional units. ### Claim 2 (depends on 1) The method of claim 1, further comprising: continuing to test the logic system design based on the second set of test cases; and updating the uncovered functional units and the current coverage. ### Claim 3 (depends on 2) The method of claim 2, further comprising: ending the test of the logic system design in response to the current coverage satisfying the preset test coverage condition. ### Claim 4 (depends on 1) The method of claim 1, wherein generating the second set of test cases according to the uncovered functional units comprises: updating the constraint according to the uncovered functional units to obtain an updated constraint; and generating the second set of test cases according to the updated constraint. ### Claim 5 (depends on 1) The method of claim 1, wherein generating the first set of test cases according to the constraint comprises: generating candidate test cases according to the constraint; and obtaining the first set of test cases by filtering the candidate test cases. ### Claim 6 (depends on 1) The method of claim 1, wherein the preset test coverage condition includes that the current coverage is higher than a given threshold. ### Claim 7 (depends on 1) The method of claim 1, wherein acquiring the constraint for generating test cases comprises: acquiring an initial constraint for generating test cases; and parsing the initial constraint to obtain the constraint. ### Claim 8 (depends on 1) The method of claim 1, further comprising: acquiring a plurality of constraints for generating test cases; generating, based on the plurality of constraints a plurality of sets of test cases satisfying the preset test coverage condition; and training a neural network model based on the plurality of constraints, the logical system design, and the plurality of sets of test cases. ### Claim 9 (depends on 1) The method of claim 1, wherein: acquiring the constraint for generating the test cases comprises acquiring a constraint input by a user and generating the constraint based on the constraint input; and generating the first set of test cases according to the constraint comprises: parsing the constraint to generate a constraint parsing code; reading the constraint parsing code to obtain candidate test cases; and generating the first set of test cases according to the candidate test cases. ### Claim 10 (depends on 9) The method of claim 9, wherein the constraint is one of a plurality of constraints including a first constraint and a second constraint, the first constraint being different from the second constraint; the method further comprising: generating the candidate test cases according to the plurality of constraints; wherein generating the first set of test cases according to the candidate test cases further comprises: filtering the plurality of candidate test cases to obtain the first set of test cases corresponding to the first constraint; and generating the second set of test cases comprises: filtering the plurality of candidate test cases to obtain the second set of test cases corresponding to the second constraint. ### Claim 11 An apparatus for generating test cases, wherein the test cases are used to test a plurality of functional units of a logic system design during a simulation process of the logic system design, the apparatus comprising: a memory storing a set of instructions; and at least one processor, configured to execute the set of instructions to: acquire a constraint for generating test cases; generate a first set of test cases according to the constraint, wherein the first set of test cases is used to cover a part of the plurality of functional units; perform a test on the logic system design based on the first set of test cases to obtain a test result; based on the test result, determine uncovered functional units that are not covered by the test and a current coverage of the test; and after the current coverage of the test is determined based on the test result, in response to the current coverage failing to satisfy a preset test coverage condition, generate a second set of test cases according to the uncovered functional units. ### Claim 12 (depends on 11) The apparatus of claim 11, wherein the processor is further configured to execute the set of instructions to: continue to test the logic system design based on the second set of test cases; and update the uncovered functional units and the current coverage. ### Claim 13 (depends on 12) The apparatus of claim 12, wherein the processor is further configured to execute the set of instructions to: end the test of the logic system design in response to the current coverage satisfying the preset test coverage condition. ### Claim 14 (depends on 11) The apparatus of claim 11, wherein the processor is further configured to execute the set of instructions to: update the constraint according to the uncovered functional units to obtain an updated constraint; and generate the second set of test cases according to the updated constraint. ### Claim 15 (depends on 11) The apparatus of claim 11, wherein the processor is further configured to execute the set of instructions to: generate candidate test cases according to the constraint; and obtain the first set of test cases by filtering the candidate test cases. ### Claim 16 (depends on 11) The apparatus of claim 11, wherein the preset test coverage condition includes that the current coverage is higher than a given threshold. ### Claim 17 (depends on 11) The apparatus of claim 11, wherein the processor is further configured to execute the set of instructions to: acquire an initial constraint for generating test cases; and parse the initial constraint to obtain the constraint. ### Claim 18 (depends on 11) The apparatus of claim 11, wherein the processor is further configured to execute the set of instructions to: acquire a plurality of constraints for generating test cases; generate, based on the plurality of constraints, a plurality of sets of test cases that satisfy the preset test coverage condition; and train a neural network model based on the plurality of constraints, the logical system design, and the plurality of sets of test cases. ### Claim 19 A non-transitory computer-readable storage medium storing a set of instructions that, when executed by a processor, causes the processor to perform a method for generating test cases, wherein the test cases are used to test a plurality of functional units of a logic system design during a simulation process of the logic system design, the method comprising: acquiring a constraint for generating test cases; generating a first set of test cases according to the constraint, wherein the first set of test cases is used to cover a part of the plurality of functional units; generating a first set of test cases according to the constraint, wherein the first set of test cases is used to cover a part of the plurality of functional units; performing a test on the logic system design based on the first set of test cases to obtain a test result; based on the test result, determining uncovered functional units that are not covered by the test and a current coverage of the test; and after the current coverage of the test is determined based on the test result, in response to the current coverage failing to satisfy a preset test coverage condition, generating a second set of test cases according to the uncovered functional units.