# US 12,111,339 B2 · State detection circuit for detecting tri-state and state detection method thereof > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,111,339 B2 - Document ID: US12111339B2 - Status: Granted - Kind: B2 - Application number: 18/050,928 - Filed: 2022-10-28 - Published: 2023-05-25 - Granted: 2024-10-08 - Earliest claimed: 2021-11-19 - Assignees: Richtek Technology Corporation - Applicants: Richtek Technology Corporation - Inventors: Chun-Jen Yu; Hsuan-Kai Wang; Chi-Jen Yang; Hsien-Chih She - Web page: https://patentgrep.com/patent/US12111339B2 ## CPC - G01R 19/1659: {to indicate that the value is within or outside a predetermined range of values (window) (G01R19/16514, G01R19/16519, G01R19/16528 and G01R19/16533 take precedence)} - G01R 31/31701: {Arrangements for setting the Unit Under Test [UUT] in a test mode} - G01R 31/317: Testing of digital circuits - G01R 31/31924: {Voltage or current aspects, e.g. driver, receiver} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A state detection circuit for detecting whether a state of an input node is floating, grounded, or electrically connected to an external voltage includes: a unidirectional device circuit and a determination circuit. The unidirectional device circuit electrically conducts a test node to a detection node unidirectionally. The detection node is coupled to the input node. The test node, the unidirectional device circuit, the detection node and the input node form a current path. The determination circuit determines a state of the input node according to a voltage level of the detection node. Within a detection stage, the state detection circuit provides a test voltage at the test node. A voltage of the detection node is determined by the input node, the test voltage, and a characteristic of the unidirectional device circuit. ## Claims ### Claim 1 A state detection circuit configured to detect whether a coupling state of an input node is floating, electrically connected to a ground potential, or electrically connected to an external voltage, wherein the state detection circuit comprises: a unidirectional-conductive device, configured to unidirectionally conduct from a test node to a detection node, the detection node being coupled to the input node, wherein a current path is formed by the test node, the unidirectional-conductive device, the detection node, and the input node, wherein the voltage across the unidirectional-conductive device, when conducting, is a forward conduction voltage; a voltage generation circuit, configured to generate and control a voltage at the test node to a high potential during a detection stage, wherein a voltage level of the detection node is determined according to the coupling state of the input node, the high potential, the conduction state of the unidirectional-conductive device, and the forward conduction voltage; and a determination circuit, configured to determine the coupling state of the input node in the detection stage according to at least one of the following conditions: (1) when the voltage level of the detection node is less than a first threshold and greater than a second threshold, the determination circuit determines that the coupling state of the input node is floating; (2) when the voltage level of the detection node is less than the second threshold, the determination circuit determines that the coupling state of the input node is electrically connected to the ground potential; and/or (3) when the voltage level of the detection node is greater than the first threshold, the determination circuit determines that the coupling state of the input node is electrically connected to the external voltage; wherein the external voltage is greater than or equal to the voltage at the test node, wherein the first threshold is greater than the second threshold. ### Claim 2 (depends on 1) The state detection circuit of claim 1, wherein in the detection stage, when the coupling state of the input node is electrically connected to the potential, the ground unidirectional-conductive device is conducting; when the coupling state of the input node is electrically connected to the external voltage, the unidirectional-conductive device is non-conducting. ### Claim 3 (depends on 1) The state detection circuit of claim 1, further comprising a discharge circuit coupled to the detection node, wherein in a discharge stage, the voltage generation circuit further configured to control the voltage at the test node to a ground potential, the discharge circuit being configured to electrically connect the ground potential of the test node to the detection node and the input node, so as to discharge the voltage levels of the detection node and the input node to the ground potential, wherein the discharge stage is earlier than the detection stage. ### Claim 4 (depends on 3) The state detection circuit of claim 3, wherein the discharge circuit is coupled in parallel with the unidirectional-conductive device. ### Claim 5 (depends on 4) The state detection circuit of claim 4, wherein the discharge circuit comprises a first transistor, which is a switch of a metal-oxide-semiconductor (MOS) transistor, and the unidirectional-conductive device corresponds to a body diode of the MOS transistor. ### Claim 6 (depends on 3) The state detection circuit of claim 3, wherein the voltage generation circuit including a buffer circuit configured to control the voltage at the test node to the high potential or the ground potential according to a driving signal. ### Claim 7 (depends on 6) The state detection circuit of claim 6, further comprising a control circuit configured to generate a first control signal and the driving signal, thereby controlling the state detection circuit to operate in the detection stage or the discharge stage, wherein the discharge circuit operates according to the first control signal. ### Claim 8 (depends on 3) The state detection circuit of claim 3, further comprising a clamping device coupled between the input node and the detection node, so that the voltage level of the detection node is clamped and does not exceed a voltage upper limit, wherein the voltage upper limit is less than the smallest one of the following: an absolute maximum rating of a withstand voltage of the unidirectional-conductive device, an absolute maximum rating of a withstand voltage of the discharge circuit, and an absolute maximum rating of a withstand voltage of the determination circuit; wherein the voltage level of the external voltage is greater than the absolute maximum rating of the withstand voltage of the unidirectional-conductive device, the absolute maximum rating of the withstand voltage of the discharge circuit, or the absolute maximum rating of the withstand voltage of the determination circuit. ### Claim 9 (depends on 8) The state detection circuit of claim 8, wherein the clamping device is a metal-oxide-semiconductor transistor having a turn-on threshold voltage, wherein the upper voltage limit is related to the turn-on threshold voltage and an enabling level of the MOS transistor. ### Claim 10 (depends on 9) The state detection circuit of claim 9, wherein the enabling level of the MOS transistor is a sum of the high potential and the turn-on threshold voltage, so that the upper voltage limit is equal to the high potential. ### Claim 11 (depends on 9) The state detection circuit of claim 9, wherein the clamping device is a depletion-type MOS transistor, or a depletion-type lateral diffused MOS transistor. ### Claim 12 (depends on 8) The state detection circuit of claim 8, wherein the first threshold is less than the upper voltage limit. ### Claim 13 (depends on 3) The state detection circuit of claim 3, which is used in a multi-pin state detection circuit, wherein the unidirectional-conductive device and the determination circuit are corresponding to sub-state detection circuit, wherein the multi-pin state detection circuit comprises: a plurality of the sub-state detection circuits, wherein a plurality of the test nodes of the plurality of sub-state detection circuits are commonly coupled to a common test node, and the voltage generation circuit, configured to generate and control a voltage at the common test node to the high potential during the detection stage, and configured to control the voltage at the common test node to the ground potential during the discharge stage. ### Claim 14 (depends on 3) The state detection circuit of claim 3, wherein in the detection stage, when the coupling state of the input node is floating, the unidirectional-conductive device is first conducting and is then non-conducting after the voltage level of the detection node being charged up by the unidirectional-conductive device. ### Claim 15 (depends on 1) The state detection circuit of claim 1, further comprising a resistor, wherein the resistor is coupled between the input node and the detection node for limiting the level of a current flowing through the current path in the detection stage. ### Claim 16 (depends on 15) The state detection circuit of claim 15, wherein a resistance of the resistor is less than an equivalent resistance of the unidirectional-conductive device when it is turned on, so that when the coupling state of the input node is electrically connected to the ground potential, in the detection stage, the voltage level of the detection node is less than the second threshold. ### Claim 17 (depends on 1) The state detection circuit of claim 1, wherein the unidirectional-conductive device comprises a P-N junction diode, a Schottky diode, a Zener diode, or a diode-coupled transistor. ### Claim 18 (depends on 1) The state detection circuit of claim 1, wherein the second threshold is less than a difference between the high potential and the forward conduction voltage, and the first threshold value is greater than the difference between the high potential and the forward conduction voltage. ### Claim 19 A state detection method, configured to detect that a coupling state of an input node is floating, electrically connected to a ground potential, or electrically connected to an external voltage, wherein the state detection method comprises: providing a unidirectional-conductive device configured to unidirectionally conduct from a test node to a detection node, and electrically conducted the detection node to the input node, so that the test node, the unidirectional-conductive device, the detection node, and the input node form a current path, wherein the voltage across the unidirectional-conductive device, when conducting, is a forward conduction voltage; providing and controlling a voltage at the test node to a high potential during a detection stage, thereby determining a voltage level of the detection node according to the coupling state of the input node, the high potential, the conduction state of the unidirectional-conductive device, and the forward conduction voltage; and determining the coupling state of the input node in the detection stage according to at least one of the following conditions: (1) when the voltage level of the detection node is less than a first threshold and greater than a second threshold, determining that the coupling state of the input node is floating; (2) when the voltage level of the detection node is less than the second threshold, determining that the coupling state of the input node is electrically connected to the ground potential; and/or (3) when the voltage level of the detection node is greater than the first threshold, determining that the coupling state of the input node is electrically connected to the external voltage; wherein the external voltage is greater than or equal to the voltage at the test node, wherein the first threshold is greater than the second threshold.