# US 12,111,269 B2 · Apparatus and method for inspecting an object > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,111,269 B2 - Document ID: US12111269B2 - Status: Granted - Kind: B2 - Application number: 17/435,925 - Filed: 2020-03-04 - Published: 2022-10-06 - Granted: 2024-10-08 - Earliest claimed: 2019-03-05 - Assignees: Sacmi Cooperative Meccanici Imola Societa' Cooperativa - Applicants: Sacmi Cooperativa Meccanici Imola Societa′ Cooperativa - Inventors: Massimo Balducci - Web page: https://patentgrep.com/patent/US12111269B2 ## CPC - G01N 21/9081: {Inspection especially designed for plastic containers, e.g. preforms} - B07C 5/342: according to optical properties, e.g. colour {(according to radiation transmittivity B07C5/3416)} - B65B 29/022: {packaging infusion material into capsules} - B65B 43/46: using grippers - B65B 43/52: using roller-ways or endless conveyors - B65B 57/04: and operating to control, or to stop, the feed of such material, containers, or packages - G01N 25/72: Investigating presence of flaws - G01N 2021/8411: {Application to online plant, process monitoring} - G01N 2021/8438: {Mutilayers} - G01N 2021/845: {Objects on a conveyor} - G01N 2021/8472: {Investigation of composite materials} - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - B07C: POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING (specially adapted for a specific purpose covered by another class, see the relevant place, e.g. A43D33/06, B23Q7/12) - B65B: MACHINES, APPARATUS OR DEVICES FOR, OR METHODS OF, PACKAGING ARTICLES OR MATERIALS; UNPACKING (bundling and pressing devices for cigars A24C1/44; devices for tensioning and securing binders adapted to be supported by the article or articles to be bound B25B25/00; applying closure members to bottles, jars or similar containers B67B1/00-B67B6/00; concurrent cleaning, filling and closing of bottles B67C7/00; emptying bottles, jars, cans, casks, barrels or similar containers B67C9/00) ## Abstract An apparatus (1) for inspecting an object, where the object is made up of a first layer of plastic material and a second layer of EVO or EVOH and has a base wall (A) and a side wall (B) which is inclined relative to the base wall (A), comprises: an inspection zone (10) in which the object can be placed for inspection: a conveyor (12) for feeding the object to the inspection zone (10) along a feed plane (P): an imaging device (14) configured to view the object positioned in the inspection zone (10) and to generate an image (143) of the object: a processor (151), configured to process the image (143), to inspect the second layer. The conveyor (12) is configured to dispose the object in the inspection zone (10) with the base wall (A) positioned according to a predetermined orientation relative to the feed plane (P). ## Claims ### Claim 1 An apparatus for inspecting an object, where the object is made up of a first layer of plastic material and a second layer of EVO or EVOH and has a base wall and a side wall which is inclined relative to the base wall, the apparatus comprising: an inspection zone in which the object can be placed for inspection; a conveyor for feeding the object to the inspection zone along a feed plane; an imaging device configured to view the object positioned in the inspection zone, to capture infrared rays having a wavelength of between 2 μm and 5 μm and to generate an image of the object as a function of the infrared rays; a processor, connected to the imaging device to receive the images generated and configured to process the images, to inspect the second layer, wherein the conveyor is configured to dispose the object in the inspection zone with the base wall positioned according to a predetermined orientation relative to the feed plane, wherein the imaging device is oriented along an inspection axis and wherein the apparatus comprises a deflecting system, the deflecting system being configured to intercept infrared rays emitted by the side wall of the object and inclined relative to the inspection axis and is configured to deflect the infrared rays in such a way as to reduce their inclination relative to the inspection axis. ### Claim 2 (depends on 1) The apparatus according to claim 1, wherein the deflecting system includes a first deflector and a second deflector and wherein the first deflector is configured to intercept the infrared rays emitted by the side wall of the object and to deflect them onto the second deflector which is configured to further deflect the infrared rays in such a way as to direct them at the imaging device. ### Claim 3 (depends on 2) The apparatus according to claim 2, wherein the first deflector and the second deflector are axisymmetric bodies whose axis of symmetry is aligned with the inspection axis and wherein the first deflector surrounds the second deflector in a plane perpendicular to the inspection axis. ### Claim 4 (depends on 3) The apparatus according to claim 3, wherein the first deflector includes a respective smooth reflective surface, surrounding the inspection axis and converging on the inspection axis in an emission direction, oriented from the inspection zone to the imaging device, and wherein the second deflector includes a smooth reflective surface, surrounding the inspection axis and converging on the inspection axis in the emission direction. ### Claim 5 (depends on 1) The apparatus according to claim 1, comprising a thermal conditioning system including: a thermometer configured to measure the temperature of the inspection zone; a control unit, configured to compare the temperature of the inspection zone with a reference temperature and to generate thermal conditioning signals as a function of the comparison. ### Claim 6 (depends on 5) The apparatus according to claim 5, comprising an insulation system including at least one wall surrounding the inspection zone to insulate the inspection zone. ### Claim 7 (depends on 1) The apparatus according to claim 1, comprising an emitting source, configured to irradiate the object in the inspection zone with an infrared light beam including wavelengths of between 2 μm and 5 μm. ### Claim 8 (depends on 7) The apparatus according to claim 7, wherein the emitting source is a LED light source. ### Claim 9 (depends on 1) The apparatus according to claim 1, comprising an interference filter configured to filter light waves directed at the camera to block light waves whose wavelength is less than 2 μm or greater than 5 μm. ### Claim 10 (depends on 1) The apparatus according to claim 1, comprising a fixed lens, connected to the imaging device and configured to operate on wavelengths of between 2 μm and 5 μm. ### Claim 11 An apparatus for inspecting an object, where the object is made up of a first layer of plastic material and a second layer of EVO or EVOH and has a base wall and a side wall which is inclined relative to the base wall, the apparatus comprising: an inspection zone in which the object can be placed for inspection; a conveyor for feeding the object to the inspection zone along a feed plane; an imaging device configured to view the object positioned in the inspection zone, to capture infrared rays having a wavelength of between 2 μm and 5 μm and to generate an image of the object as a function of the infrared rays; a processor, connected to the imaging device to receive the images generated and configured to process the images, to inspect the second layer; a thermal conditioning system including a thermometer, configured to measure the temperature of the inspection zone, and a control unit, configured to compare the temperature of the inspection zone with a reference temperature and to generate thermal conditioning signals as a function of the comparison, and a deflecting system configured to divert the infrared rays that do not fall within a field of vision of the imaging device and direct them into the field of vision of the imaging device, thus allowing them to be captured by the imaging device. ### Claim 12 (depends on 11) The apparatus according to claim 11, wherein the thermal conditioning system further includes a heater, configured to vary the temperature of the inspection zone as a function of the thermal conditioning signals. ### Claim 13 (depends on 11) The apparatus according to claim 11, comprising a thermal insulation system including at least one wall surrounding the inspection zone to thermally insulate the inspection zone. ### Claim 14 A method for inspecting an object, where the object is made up of a first layer of plastic material and a second layer of EVO or EVOH and has a base wall and a side wall which is inclined relative to the base wall, the method comprising the following steps: feeding the object to an inspection zone along a feed plane, wherein the base wall of the object is disposed in the inspection zone according to a predetermined orientation relative to the feed plane; capturing infrared rays having a wavelength of between 2 μm and 5 μm, using an imaging device; generating an image of the object as a function of the infrared radiation captured; processing the image, using a processor, to inspect the second layer of the object, and a deflecting step, wherein the imaging device is oriented along an inspection axis and wherein infrared rays emitted by the side wall of the object are diverted so as to reduce their inclination relative to the inspection axis. ### Claim 15 (depends on 14) The method according to claim 14, comprising a step of irradiating the object in the inspection zone through an emitting source, wherein the emitting source irradiates the object with a light beam having a wavelength of between 2 μm and 5 μm. ### Claim 16 (depends on 14) The method according to claim 14, comprising a step of thermal conditioning, including the following steps: measuring the temperature of the inspection zone using a thermometer; comparing the temperature of the inspection zone with a reference temperature; generating thermal conditioning signals as a function of the result of the step of comparing. ### Claim 17 (depends on 16) The method according to claim 16, wherein the thermal conditioning further includes a step of varying the temperature of the inspection zone, using a heater, as a function of the thermal conditioning signals. ### Claim 18 (depends on 14) The method according to claim 14, comprising a step of thermally insulating the inspection zone through a wall surrounding the inspection zone.