# US 12,111,147 B2 · Designing and constructing dot projectors for three-dimensional sensor modules > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,111,147 B2 - Document ID: US12111147B2 - Status: Granted - Kind: B2 - Application number: 17/639,734 - Filed: 2020-09-03 - Published: 2022-09-15 - Granted: 2024-10-08 - Earliest claimed: 2019-09-04 - Assignees: ams Sensors Singapore Pte. Ltd. - Applicants: ams Sensors Singapore Pte. Ltd - Inventors: Olivier Ripoll - Web page: https://patentgrep.com/patent/US12111147B2 ## CPC - G01B 11/2513: {with several lines being projected in more than one direction, e.g. grids, patterns} - G01B 11/254: {Projection of a pattern, viewing through a pattern, e.g. moiré} - G02B 27/425: {in illumination systems (mask illumination systems in photolithographic systems G03F7/70158)} - G03B 21/2013: {Plural light sources} - G03B 21/2033: {LED or laser light sources} - G03B 21/2046: {Positional adjustment of light sources} - G06V 10/993: {Evaluation of the quality of the acquired pattern} - H04N 23/56: provided with illuminating means - G02B 27/0012: {Optical design, e.g. procedures, algorithms, optimisation routines} - G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS - G02B: OPTICAL ELEMENTS, SYSTEMS OR APPARATUS - G03B: APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR (optical parts of such apparatus G02B; photosensitive materials or processes for photographic purposes G03C; apparatus for processing exposed photographic materials G03D) - G06V: IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING - H04N: PICTORIAL COMMUNICATION, e.g. TELEVISION ## Abstract For an optical dot projector having multiple light emitters, a relationship is determined between locations of the light emitters with respect to a substrate of the optical dot projector and corresponding first locations of dots projected by the dot projector onto an imaging plane. An optical grating approximating one or more optical characteristics of one or more optical elements of the optical dot projector is determined based on the relationship. Second locations of dots corresponding to a replacement of the one or more optical elements of the optical dot projector by the optical grating are determined, and modified locations of the light emitters with respect to the substrate are determined based on the second locations of dots. Optical dot projectors are constructed according to the determined modified locations. ## Claims ### Claim 1 A method comprising: determining, for an optical dot projector having a plurality of light emitters, a relationship between locations of the plurality of light emitters with respect to a substrate of the optical dot projector and corresponding first locations of dots projected by the dot projector onto an imaging plane; determining, based on the relationship, an optical grating approximating one or more optical characteristics of one or more optical elements of the optical dot projector; determining second locations of dots corresponding to a replacement of the one or more optical elements of the optical dot projector by the optical grating; determining, based on the second locations of dots, modified locations of the plurality of light emitters with respect to the substrate to reduce a distortion in a spatial pattern of the dots projected by the dot projector; and constructing a plurality of optical dot projectors, each having a respective plurality of light emitters arranged according to the determined modified locations. ### Claim 2 (depends on 1) The method of claim 1, wherein the relationship comprises a transfer function indicating the first locations of dots projected by the dot projector onto the imaging plane as a function of the locations of the plurality of light emitters with respect to the substrate of the optical dot projector. ### Claim 3 (depends on 1) The method of claim 1, wherein the plurality of light emitters comprises a plurality of vertical cavity surface emitting laser (VSCEL) emitters arranged on the substrate. ### Claim 4 (depends on 1) The method of claim 1, wherein the optical grating is determined based on a curvature of the first locations of dots with respect to a horizontal dimension of the imaging plane. ### Claim 5 (depends on 4) The method of claim 4, wherein the optical grating is further determined based on a curvature of the first locations of dots with respect to a vertical dimension of the imaging plane. ### Claim 6 (depends on 1) The method of claim 1, wherein the one or more optical elements comprises one or more diffractive optical elements. ### Claim 7 (depends on 1) The method of claim 1, wherein determining the optical grating approximating the optical characteristics of the one or more optical elements of the optical dot projector comprises determining a first periodicity of the optical grating with respect to a first dimension. ### Claim 8 (depends on 7) The method of claim 7, wherein determining the optical grating approximating the optical characteristics of the one or more optical elements of the optical dot projector further comprises determining a second periodicity of the optical grating with respect to a second dimension, the second dimension being orthogonal to the first dimension. ### Claim 9 (depends on 1) The method of claim 1, further comprising constructing a plurality of optical sensor modules, wherein constructing the plurality of optical sensor modules comprises, for each optical sensor module, packaging a respective optical dot projector of the plurality of optical dot projects and a respective image sensor in the optical sensor module. ### Claim 10 (depends on 1) The method of claim 1, wherein determining the relationship comprises: projecting, using the optical dot project, the dots onto the imaging plane; measuring the locations of the plurality of light emitters with respect to the substrate of the optical dot projector; measuring the first locations of the dots with respect to the imaging plane; and determining the relationship based on the measured locations of the plurality of light emitters with respect to the substrate of the optical dot projector and the measured first locations of the dots with respect to the imaging plane.