Semiconductor device and semiconductor device identification method

A semiconductor device comprising:

• a first external terminal;
• a second external terminal to which a second voltage is to be applied;
• first wiring connected to the first external terminal;
• second wiring connected to the second external terminal;
• a first internal block circuit connected to the first wiring;
• a first resistor and a first switching element serially connected between the first wiring and the second wiring;
• a second resistor connected between the first wiring and the second wiring;
• and
• a test circuit configured to control a switching operation of the first switching element,
• wherein the first external terminal is an input terminal to which a control signal to control the first internal block circuit is input,
• the test circuit turns on or off the first switching element based on supply of a drive voltage, and
• a length of the first wiring between the first external terminal and the first resistor is smaller than a length of the first wiring between the first external terminal and the second resistor.