Safety system for needle probe card for high-voltage and high-current test on power semiconductor devices, related test machine and corresponding testing method

A safety system for a needle probe card for test machines for high-voltage and high-current testing of power semiconductor electronic devices;

• said needle probe card comprising a plurality of needles adapted to be placed in contact with a device under test (DUT), each needle of said plurality of needles being configured to allow a flow of an electric current;
• said safety system comprising:
• a control unit capable of determining the electric current flowing in every single needle;
• a plurality of switching devices configured to selectively interrupt the electric current flowing in said needles;
• at least one switching device of the plurality of switching devices being associated with each needle of said needle probe card;
• said control unit being configured to drive every single switching device to selectively interrupt the flow of the electric current in a corresponding needle.