Ion analysis device
AssigneeShimadzu Corporation
InventorHidenori Takahashi
Life of this patent
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Abstract
An ion analysis device 1 configured to generate and analyze product ions from precursor ions derived from a sample component includes: a reaction chamber 132 into which the precursor ions are introduced; a radical emitter 134 made of a predetermined kind of metal and disposed in the reaction chamber or a space communicating with the reaction chamber, at least a part of a surface of the radical emitter being oxidized or nitrided; a heating unit 20 configured to heat the radical emitter to a predetermined temperature; and separation detection units 135 and 136 configured to separate and detect, according to at least one of a mass-to-charge ratio and an ion mobility, product ions generated from the precursor ions by a reaction with radicals emitted from the radical emitter heated to the predetermined temperature.
Claims10
An ion analysis device configured to generate and analyze product ions from precursor ions derived from a sample component, the ion analysis device comprising:
- a reaction chamber into which the precursor ions are introduced;
- a radical emitter made of a predetermined kind of metal and disposed in the reaction chamber or a space communicating with the reaction chamber, at least a part of a surface of the radical emitter being oxidized or nitrided;
- a heating unit configured to heat the radical emitter to a predetermined temperature;
- and
- a separation detection unit configured to separate and detect, according to at least one of a mass-to-charge ratio and an ion mobility, product ions generated from the precursor ions by a reaction with radicals emitted from the radical emitter heated to the predetermined temperature.
Dependencies are inferred from the claim text.