High power laser profiler
AssigneeThe Johns Hopkins University
InventorsLeo R. Gauthier, Jr., Kenneth W. Harclerode
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Abstract
Provided herein are a system and a method thereof which allows for calibrating a laser or getting characteristics of the laser by measuring the temporally and spatially resolved beam profile and power density cross-section using non-contact radiometry. An example method includes receiving a radiation beam from a light source by protrusions that protrude from a plate. The example method further includes imaging the protrusions, measuring a respective temperature of each of the protrusions based on the imaging, and profiling the radiation beam based on the measuring.
Claims18
A system comprising:
- a plate comprising protrusions, wherein the protrusions are configured to receive a radiation beam emitted by a light source and have a predetermined diameter and are spaced apart such that heat travels along a respective length of each of the protrusions without affecting heat in another one of the protrusions;
- and
- a first detector comprising a radiance imaging device, wherein the first detector is configured to measure a respective temperature of each of the protrusions.
A method comprising:
- receiving a radiation beam from a light source by protrusions that protrude from a plate;
- imaging the protrusions;
- measuring a respective temperature of each of the protrusions based on the imaging;
- and
- profiling the radiation beam based on the measuring, wherein
- the protrusions are spaced apart such that heat travels along a respective length of each of the protrusions without effecting other ones of the protrusions.
An apparatus comprising:
- a plate comprising protrusions, wherein
- the protrusions are configured to receive a radiation beam that causes temperature changes within the protrusions, and
- wherein the protrusions have a predetermined diameter and are spaced apart such that heat travels along a respective length of each of the protrusions without affecting heat in another one of the protrusions;
- and
- a coating on at least a light receiving end of each of the protrusions, wherein the coating affects higher emissivity.
Dependencies are inferred from the claim text.