Connection device and specimen inspection automating system provided with same
AssigneeHitachi High-Tech Corporation
InventorsShigeki Yamaguchi, Masashi Endo, Naoto Tsujimura
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AssigneeHitachi High-Tech Corporation
InventorsShigeki Yamaguchi, Masashi Endo, Naoto Tsujimura
Estimating the term…
Provided is a connection device to which an automatic analysis device can be connected from a plurality of directions, and a specimen inspection automating system provided with the connection device. A connection device (220) is provided with: a specimen carrier conveyance part (225) that conveys a specimen carrier (10) housing a specimen; and a carousel (221) that is configured so as to be able to hold a plurality of specimen carriers (10) carried in from the specimen carrier conveyance part (225) and that conveys the held specimen carriers (10) to specimen sampling positions (293a, 293b, 293c) for receiving a specimen sampling mechanism (305) from an external automatic analysis device (300) at a prescribed interval.
A connection device comprising:
Dependencies are inferred from the claim text.