Method of processing an EDX/XRF map and a corresponding image processing device
AssigneeBruker Nano, Inc.
InventorThomas Schwager
Life of this patent
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AssigneeBruker Nano, Inc.
InventorThomas Schwager
Estimating the term…
The present invention refers to a method of processing an energy-dispersive X-ray (EDX)/X-ray fluorescence (XRF) map (1), comprising selecting a data point (dp) among a plurality of data points of the EDX/XRF map (1), wherein each of the data points comprise a local measured value (m) and a local dispersion value (v) of a measured variable; determine a first modified mean value (M[1]) based on the local measured value (m) of the selected data point (dp) and the local measured value of at least one neighboring data point neighboring the selected data point (dp) and determine a first modified dispersion value (V[1]) based on the local dispersion value (v) of the selected data point (dp) and the dispersion value of the at least one neighboring data point, when m<th, and replace the local measured value (m) of the selected data point (dp) by the first modified mean value (M[1]), when M[1]>TH[1].
A method of processing an energy-dispersive X-ray (EDX)/X-ray fluorescence (XRF) map (1), comprising the steps:
Dependencies are inferred from the claim text.