Apparatus and method for element analysis of materials by means of optical emission spectroscopy
AssigneeFraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
InventorVolker Sturm
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AssigneeFraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
InventorVolker Sturm
Estimating the term…
A device may be provided for element analysis of materials by means of optical emission spectroscopy, particularly by means of laser-induced plasma spectroscopy, said device having: means for exciting a plasma from a partial quantity of a test sample made of the material to be analyzed; means for detecting and for spectral analysis of optical radiation emitted from the plasma; beam guidance means for guiding at least a part of the optical radiation emitted from the plasma to the means for detecting and spectral analysis; and means for flushing at least one partial region of the device with an inert gas, wherein the beam guidance means are at least one capillary tube, which additionally serves to guide the inert gas. A method may be provided for element analysis of materials by means of optical emission spectroscopy using the device.
An apparatus for element analysis of materials by means of laser-induced plasma spectroscopy, comprising:
A method for element analysis of materials by laser-induced plasma spectroscopy, comprising:
An apparatus for element analysis of materials by laser-induced plasma spectroscopy, comprising:
Dependencies are inferred from the claim text.