Apparatus, systems and methods for detecting light
AssigneePantech Co., Ltd.
InventorsXin Yuan, Paul Wilford, Mu Qiao, Xuan Liu
Life of this patent
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AssigneePantech Co., Ltd.
InventorsXin Yuan, Paul Wilford, Mu Qiao, Xuan Liu
Estimating the term…
An apparatus comprising: a double path interferometer comprising a sample path for an object and a reference path; a source of linearly polarized light for the double path interferometer, a phase plate positioned in the sample path; means for superposing the sample path and reference path to create a beam of light for detection; means for spatially modulating the beam of light to produce a modulated beam of light; means for dispersing the modulated beam of light to produce a spatially modulated and dispersed beam of light; a first detector; a second detector, and means for splitting the spatially modulated and dispersed beam of light, wherein light of a first linear polarization is directed to the first detector and light of a second linear polarization, orthogonal to the first linear polarization, is directed to the second detector.
An apparatus comprising:
An apparatus comprising:
An optical coherence tomography apparatus comprising:
Dependencies are inferred from the claim text.