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US 12,069,857 B2Granted
Memory cell, memory device manufacturing method and memory device operation method thereof
AssigneeMacronix International Co., Ltd.
InventorsYu-Hsuan Lin, Feng-Min Lee, Po-Hao Tseng
Life of this patent
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Abstract
The application discloses an integrated memory device, a manufacturing method and an operation method thereof. The integrated memory cell includes: a first memory cell; and an embedded second memory cell, serially coupled to the first memory cell, wherein the embedded second memory cell is formed on any one of a first side and a second side of the first memory cell.
Claims6
An integrated memory cell including:
- a first memory cell;
- and
- an embedded second memory cell, serially coupled to the first memory cell,
- wherein the embedded second memory cell is formed on any one of a first side and a second side of the first memory cell;
- the embedded second memory cell is formed at a bottom of a contact, or formed at a top or a bottom of a via;
- and
- the embedded second memory cell is embedded in a source/drain region of the first memory cell, a top surface of the embedded second memory cell is above a top surface of the source/drain region, and a bottom surface of the embedded second memory cell is below the top surface of the source/drain region.
4 more elements
Dependencies are inferred from the claim text.