Superlattice-based detector systems and methods
AssigneeTeledyne FLIR Commercial Systems, Inc.
InventorEdward K. Huang
Life of this patent
Estimating the term…
Loading patent…
AssigneeTeledyne FLIR Commercial Systems, Inc.
InventorEdward K. Huang
Estimating the term…
Techniques are disclosed for facilitating detection of electromagnetic radiation using superlattice-based detector systems and methods. In one example, an infrared detector includes a first superlattice structure including first periods. Each of the first periods includes a first sub-layer and a second sub-layer adjacent to the first sub-layer. The first and second sub-layers include first and second semiconductor materials. The infrared detector further includes a second superlattice structure disposed on the first superlattice structure. The second superlattice structure includes second periods. Each of the second periods includes a third sub-layer and a fourth sub-layer adjacent to the third sub-layer. The third-sub-layer includes a third semiconductor material. The fourth sub-layer includes a fourth semiconductor material. A p-n junction is formed at an interface within the second superlattice structure or at an interface between the first and second superlattice structures.
An infrared detector comprising:
A method comprising:
Dependencies are inferred from the claim text.