Method of optical quality inspection of workpieces
AssigneeMectron Engineering Company, Inc.
InventorAndrew Hanna
Life of this patent
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AssigneeMectron Engineering Company, Inc.
InventorAndrew Hanna
Estimating the term…
A method for inspecting nominally identical workpieces with manufacturing tolerances involves feeding a workpiece to an inspection device; applying a simultaneous translatory and rotational movement to the workpiece via the inspection device while illuminating the workpiece; repeatedly taking camera images of the workpiece during the simultaneous translatory and rotational movement as the workpiece moves across a camera window, the camera images consisting of pixels; setting workpiece parameters based on size and shape of the workpiece; assembling a composite image from the camera images based on the workpiece parameters; determining numerical brightness scores of the workpiece, comparing the determined numerical brightness scores with known numerical brightness scores; assigning a discrepancy score; setting a discrepancy score threshold; determining that the workpiece passes inspection when the discrepancy score is below the discrepancy score threshold; and that the workpiece fails the inspection when the discrepancy score is above the discrepancy score threshold.
A method for optically inspecting nominally identical workpieces of a circular cross-section with manufacturing tolerances, the method comprising:
Dependencies are inferred from the claim text.