Data processing method, device and system, and electronic device

A data processing method applied to an electronic device, the electronic device including a data processing device and a display device coupled to the data processing device, the display device being configured to display interfaces, the data processing device being configured to implement the data processing method, and the data processing method comprising:

• obtaining, by the data processing device, a defect type of a sample set, the sample set including a plurality of samples, each sample having a first parameter and a second parameter, the first parameter being used to represent a defect degree of the sample with regard to the defect type, and the second parameter being used to represent device information of a plurality of sample production devices through which the sample passes, wherein the sample includes a display panel motherboard, the display panel motherboard includes a plurality of display panels, and the device information of the plurality of sample production devices through which the sample passes and information of the defect types of the plurality of samples are generated by the plurality of sample production devices;
• calculating, by the data processing device, yield purity indexes of the plurality of sample production devices on the plurality of samples based on first parameters and second parameters of the plurality of samples, so as to obtain influencing parameters of the plurality of sample production devices, an influencing parameter of each sample production device being used to represent an influence degree to which the sample production device affects an occurrence of the defect type on the plurality of samples, correlation between the sample production device and the defect type being determined by the data processing device, so as to locate the defect type and adjust a production process;
• and
• transmitting, by the data processing device, the obtained influencing parameters of the plurality of sample production devices to the display device;
• and
• the data processing method further comprising:
• creating, by the data processing device, the sample set;
• and
• determining, by the data processing device, the plurality of sample production devices;
• wherein the first parameter of the sample includes a defect degree representation value of the sample;
• and
• the data processing method further comprises:
• obtaining, by the data processing device, a focus threshold;
• and
• dividing, by the data processing device, the plurality of samples into non-defective samples and defective samples according to defect degree representation values in the first parameters of the plurality of samples and the focus threshold;
• wherein obtaining, by the data processing device, the focus threshold includes:
• obtaining, by the data processing device, the focus threshold according to the defect degree representation values in the first parameters of the plurality of samples;
• and
• wherein obtaining, by the data processing device, the focus threshold according to the defect degree representation values in the first parameters of the plurality of samples, includes:
• dividing, by the data processing device, an initial array into a first array and a second array according to a first index, the initial array including the defect degree representation values in the first parameters of the plurality of samples that are arranged in order of size, and the first index being used to indicate a division position in the initial array;
• obtaining, by the data processing device, a first average value of all elements in the first array and a second average value of all elements in the second array;
• generating, by the data processing device, a third array and a fourth array, the third array being composed of deviation degrees of all the elements of the initial array compared with the first average value, and the fourth array being composed of deviation degrees of all the elements of the initial array compared with the second average value;
• determining, by the data processing device, a second index, the second index being used to indicate a position at which a positive-negative inversion occurs in differences between all the elements in the third array and corresponding elements in the fourth array;
• updating, by the data processing device, the first index to the second index if the second index is not equal to the first index, and repeating above steps until the first index is equal to the second index;
• and
• calculating, by the data processing device, an average value of two adjacent elements in the first array and the second array corresponding to the first index as the focus threshold.

A data processing device included in an electronic device, the electronic device including the data processing device and a display device coupled to the data processing device, the interfaces including a first interface, a second interface, a third interface and a sixth interface, the display device being configured to display interfaces, and the data processing device comprising:

• a memory having stored thereon one or more computer programs;
• and
• a processor coupled to the memory, the processor being configured to execute the computer programs to cause the data processing device to implement a data processing method,
• the data processing method comprising:
• obtaining a defect type of a sample set in response to a first input of a user on the first interface of the display device, the sample set including a plurality of samples, each sample having a first parameter and a second parameter, the first parameter being used to represent a defect degree of the sample with regard to the defect type, and the second parameter being used to represent device information of a plurality of sample production devices through which the sample passes, wherein the sample includes a display panel motherboard, the display panel motherboard includes a plurality of display panels, and the device information of the plurality of sample production devices through which the sample passes and information of the defect types of the plurality of samples are generated by the plurality of sample production devices;
• calculating yield purity indexes of the plurality of sample production devices on the plurality of samples based on first parameters and second parameters of the plurality of samples, so as to obtain influencing parameters of the plurality of sample production devices, an influencing parameter of each sample production device being used to represent an influence degree to which the sample production device affects an occurrence of the defect type on the plurality of samples, correlation between the sample production device and the defect type being determined by the data processing device, so as to locate the defect type and adjust a production process;
• transmitting the obtained influencing parameters of the plurality of sample production devices to the display device;
• and
• displaying the influencing parameters of the plurality of sample production devices on the second interface of the display device;
• and
• the data processing method further comprising:
• creating the sample set in response to a fourth input of the user on the sixth interface of the display device;
• and
• determining the plurality of sample production devices in response to a second input of the user on the third interface of the display device;
• wherein the first parameter of the sample includes a defect degree representation value of the sample, and the data processing method further comprises:
• obtaining by the data processing device, a focus threshold according to defect degree representation values in the first parameters of the plurality of samples;
• and
• dividing by the data processing device, the plurality of samples into non-defective samples and defective samples according to the defect degree representation values in the first parameters of the plurality of samples and the focus threshold;
• and
• wherein obtaining the focus threshold according to the defect degree representation values in the first parameters of the plurality of samples, includes:
• dividing an initial array into a first array and a second array according to a first index, the initial array including the defect degree representation values in the first parameters of the plurality of samples that are arranged in order of size, and the first index being used to indicate a division position in the initial array;
• obtaining a first average value of all elements in the first array and a second average value of all elements in the second array;
• generating a third array and a fourth array, the third array being composed of deviation degrees of all the elements of the initial array compared with the first average value, and the fourth array being composed of deviation degrees of all the elements of the initial array compared with the second average value;
• determining a second index, the second index being used to indicate a position at which a positive-negative inversion occurs in differences between all the elements in the third array and corresponding elements in the fourth array;
• updating he first index to the second index if the second index is not equal to the first index, and repeating the above steps until the first index is equal to the second index;
• and
• calculating an average value of two adjacent elements in the first array and the second array corresponding to the first index as the focus threshold;
• or, the data processing method comprising:
• obtaining the defect type of the sample set, the sample set including the plurality of samples, each sample having the first parameter and the second parameter, the first parameter being used to represent the defect degree of the sample with regard to the defect type, and the second parameter being used to represent the device information of the plurality of sample production devices through which the sample passes, wherein the sample includes a display panel motherboard, the display panel motherboard includes a plurality of display panels, and the device information of the plurality of sample production devices through which the sample passes and information of the defect types of the plurality of samples are generated by the plurality of sample production devices;
• calculating the yield purity indexes of the plurality of sample production devices on the plurality of samples based on the first parameters and the second parameters of the plurality of samples, so as to obtain the influencing parameters of the plurality of sample production devices, the influencing parameter of each sample production device being used to represent the influence degree to which the sample production device affects the occurrence of the defect type on the plurality of samples, correlation between the sample production device and the defect type being determined by the data processing device, so as to locate the defect type and adjust a production process;
• and
• transmitting the obtained influencing parameters of the plurality of sample production devices to the display device;
• and
• the data processing method further comprising:
• creating the sample set;
• and
• determining the plurality of sample production devices;
• wherein the first parameter of the sample includes a defect degree representation value of the sample;
• and
• the data processing method further comprises:
• obtaining, by the data processing device, a focus threshold;
• and
• dividing, by the data processing device, the plurality of samples into non-defective samples and defective samples according to defect degree representation values in the first parameters of the plurality of samples and the focus threshold;
• wherein obtaining the focus threshold includes:
• obtaining the focus threshold according to the defect degree representation values in the first parameters of the plurality of samples;
• and
• wherein obtaining the focus threshold according to the defect degree representation values in the first parameters of the plurality of samples, includes:
• dividing an initial array into a first array and a second array according to a first index, the initial array including the defect degree representation values in the first parameters of the plurality of samples that are arranged in order of size, and the first index being used to indicate a division position in the initial array;
• obtaining a first average value of all elements in the first array and a second average value of all elements in the second array;
• generating a third array and a fourth array, the third array being composed of deviation degrees of all the elements of the initial array compared with the first average value, and the fourth array being composed of deviation degrees of all the elements of the initial array compared with the second average value;
• determining a second index, the second index being used to indicate a position at which a positive-negative inversion occurs in differences between all the elements in the third array and corresponding elements in the fourth array;
• updating the first index to the second index if the second index is not equal to the first index, and repeating above steps until the first index is equal to the second index;
• and
• calculating an average value of two adjacent elements in the first array and the second array corresponding to the first index as the focus threshold.