Safety container for high power device testing over a range of temperatures
AssigneeKeithley Instruments, LLC
InventorsAaron Ferguson, James D. Bucci, Gregory Sobolewski, Brian D. Smith, Jeffrey J. Trgovich
Life of this patent
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Abstract
A safety container for high-power, electronic device testing, the safety container including a first shell and first and second ports in the first shell. The first shell is configured to substantially surround a testing chamber sized to accommodate a device-under-test (DUT). The first shell is substantially rigid. The first port is configured to allow a fluid into the testing chamber, the second port configured to allow the fluid to exit the testing chamber.
Claims18
A safety container for high-power, electronic device testing, the safety container comprising:
- a first shell configured to substantially surround a testing chamber sized to accommodate a device-under-test (DUT), the first shell being substantially rigid and configured to couple with a support surface, the safety container further comprising a gasket around a rim of the first shell, the gasket configured to form a seal between the first shell and support surface;
- and
- first and second ports in the first shell, the first port configured to allow a fluid into the testing chamber, the second port configured to allow the fluid to exit the testing chamber.
A method of testing an electronic device-under-test (DUT), the method comprising:
- positioning the DUT within a testing chamber, the testing chamber being substantially surrounded by a substantially rigid first shell that is sized to accommodate the DUT and configured to couple with a support surface, the safety container further comprising a gasket around a rim of the first shell, the gasket configured to form a seal between the first shell and support surface, the first shell having first and second ports, the first port configured to allow a fluid into the testing chamber, the second port configured to allow the fluid to exit the testing chamber;
- and
- applying a high-power electrical signal to test the DUT.
Dependencies are inferred from the claim text.