Contact socket module and method of testing electronic components using a contact socket module
AssigneeCohu GmbH
InventorsKarl Croce, Markus Wagner
Life of this patent
Estimating the term…
Abstract
A contact socket module for use in an automated test equipment (ATE) for testing electronic components (DUTs) being carried by a carrier comprises: a plurality of groups of spring contacts, wherein each spring contact comprises a DUT sided contact tip, a retracting plate being moveable, and a controller controlling the movement of the retracting plate, wherein the retracting plate and the spring contacts act mechanically on each other. In a first position the DUT sided contact tips are adapted to contact to contact portions of the electronic components, and in a second position, the DUT sided contact tips are adapted to release the contact to the contact portions of the electronic components.
Claims18
A contact socket module for use in an automated test equipment (ATE) for testing electronic components (DUTs) being carried by a carrier comprises:
- a plurality of groups of spring contacts, wherein each spring contact from the plurality of groups of spring contacts comprises a DUT sided contact tip,
- a retracting plate being moveable, and a controller controlling a movement of the retracting plate, wherein the retracting plate acts mechanically on the plurality of groups of spring contacts,
- so that in a test position the retracting plate is in a first position and the DUT sided contact tips are adapted to contact contact portions of the electronic components in the first position of the retracting plate, and the retracting plate is in a second position, when the DUT sided contact tips are adapted so that the contact with the contact portions of the electronic components is released, wherein the controller controls the movement of the retracting plate from the first position into the second position, and back from the second position into the first position.
An automated test equipment (ATE), comprising:
- a contactor, and
- at least two contact socket modules, wherein the at least two contact socket modules are arranged parallel to each other in a main plane of the contactor, so that the at least two contact socket modules are adapted to contact to at least two times of a number of electronic components simultaneously.
A method of testing electronic components (DUTs) with a contact socket module in an automated test equipment (ATE), wherein the contact socket module comprises
- a plurality of groups of spring contacts, wherein each spring contact from the plurality of groups of spring contacts comprises at least one DUT sided contact tip,
- a retracting plate being moveable, wherein the retracting plate acts mechanically on the plurality of groups of spring contacts, and a controller, the method comprising:
- controlling a movement of the retracting plate by the controller, wherein the controller controls the movement of the retracting plate from a first position into a second position, and back from the second position into the first position,
- testing the electronic components (DUTs) when the retracting plate is in the first position where the at least one DUT sided contact tips are adapted to contact contact portions of the electronic components, wherein
- controlling the movement of the retracting plate into the second position, when the at least one DUT sided contact tips are adapted to releasing the contact with the contact portions of the electronic components.
Dependencies are inferred from the claim text.