Systems and methods for performing multiple precurser, neutral loss and product ion scans in a single ion trap
AssigneePurdue Research Foundation
InventorsRobert Graham Cooks, Dalton Snyder
Life of this patent
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Abstract
The invention generally relates to systems and methods for performing multiple precursor, neutral loss and product ion scans in a single ion trap. In certain aspects, the invention provides systems including a mass spectrometer having a single ion trap, and a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply at least one of the following ion scans to a single ion population in the single ion trap: multiple precursor ion scans, a plurality of segmented neutral loss scans, or multiple simultaneous neutral loss scans.
Claims20
A system comprising:
- a mass spectrometer comprising a single ion trap;
- and
- a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply at least one of the following ion scans to a single ion population in the single ion trap and prior to an ejection event:
- multiple precursor ion scans, a plurality of segmented neutral loss scans, or multiple simultaneous neutral loss scans.
A method for analyzing a single ion population, the method comprising;
- generating a single ion population that is transferred into a single ion trap of a mass spectrometer;
- and
- applying, via a CPU operably associated with the mass spectrometer, at least one of the following ion scans to the single ion population in the single ion trap and prior to an ejection event:
- multiple precursor ion scans, a plurality of segmented neutral loss scans, or multiple simultaneous neutral loss scans.
A method for analyzing a sample, the method comprising;
- generating a single ion population from a sample that is transferred into a single ion trap of a mass spectrometer;
- and
- applying, via a CPU operably associated with the mass spectrometer, at least one of the following ion scans to the single ion population in the single ion trap and prior to an ejection event:
- multiple precursor ion scans, a plurality of segmented neutral loss scans, or multiple simultaneous neutral loss scans, thereby analyzing the sample.
Dependencies are inferred from the claim text.