Measuring device
AssigneeDr. Johannes Heidenhain GmbH
InventorsDaniel Auer, Christoph Heinemann, Marc Oliver Tiemann
Life of this patent
Estimating the term…
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AssigneeDr. Johannes Heidenhain GmbH
InventorsDaniel Auer, Christoph Heinemann, Marc Oliver Tiemann
Estimating the term…
A measuring device includes first and second component groups rotatable about an axis relative to each other. The first component group has a scanning component, having a first substrate, and the second component group has a scale component, having a second substrate and an angle scale. The measuring device can determine a relative angular position between the component groups. The measuring device has a passive sensor array having conductor track structures. The conductor track structures are applied on the first substrate by an additive process so that the sensor array determines a torsional load of the first substrate about the axis. Alternatively, the conductor track structures are applied on the second substrate by an additive process so that the sensor array determines a torsional load of the second substrate about the axis.
A measuring device, comprising:
Dependencies are inferred from the claim text.