Embedded light shield structure for CMOS image sensor
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsShih-Hsun Hsu, Ping-Hao Lin
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsShih-Hsun Hsu, Ping-Hao Lin
Estimating the term…
In some embodiments, an image sensor is provided. The image sensor comprises a first photodetector disposed within a front-side surface of a semiconductor substrate. A trench isolation structure is disposed over a back-side surface of the semiconductor substrate. The trench isolation structure includes a buffer layer and a dielectric liner. The buffer layer covers the back-side surface of the semiconductor substrate and fills trenches that extend downward into the back-side surface of the semiconductor substrate. The dielectric liner is disposed between the buffer layer and the semiconductor substrate. A composite grid structure has composite grid segments that are aligned over the trenches, respectively. The buffer layer separates the dielectric liner from the composite grid structure. A light shield structure is disposed within the buffer layer and directly overlies the first photodetector.
A method for forming an image sensor, the method comprising:
A method for forming an image sensor, the method comprising:
A method for forming an image sensor, the method comprising:
Dependencies are inferred from the claim text.