Pattern acquisitions in equivalent time sampling systems
AssigneeTektronix, Inc.
InventorsNoah Brummer, Andy K. Lim, Jan P. Peeters Weem
Life of this patent
Estimating the term…
Abstract
An equivalent-time sampling test and measurement instrument for acquiring a repeating pattern signal under test at or near a maximum sampling speed of the test and measurement instrument. The test and measurement instrument includes a first input configured to receive repeating pattern information about a signal under test, a second input configured to receive the signal under test, one or more processors configured to determine an optimized trigger holdoff period that is set based on a minimum trigger holdoff period of a test and measurement instrument, and an acquisition unit configured to acquire a portion of the signal under test every optimized trigger holdoff period.
Claims12
An equivalent-time sampling test and measurement instrument, comprising:
- a first input configured to receive information about a signal under test that includes a repeating pattern;
- a second input configured to receive the signal under test;
- a processor configured to:
- determine a pattern period based on the received information including a symbol rate and a pattern length;
- determine a sample spacing relative to a number of samples per symbol and the symbol rate;
- determine an optimized trigger holdoff period based on the pattern period and the sample spacing;
- generate the optimized trigger holdoff period relative to a minimum trigger holdoff period of the test and measurement instrument;
- and
- acquire a portion of the signal under test every optimized trigger holdoff period.
A method for acquiring a signal under test that includes a repeating pattern, comprising:
- receiving information about the signal under test;
- determining a pattern period based on the received information including a symbol rate and a pattern length;
- determining a sample spacing based on a number of samples per symbol and the symbol rate;
- generating an optimized trigger holdoff period relative to the pattern period and the sample spacing;
- and
- acquiring a waveform representing at least a portion of the signal under test by sampling a portion of the signal under test every optimized trigger holdoff period.
One or more non-transitory computer-readable storage media comprising instructions, which, when executed by one or more processors of a test and measurement instrument, cause the test and measurement instrument to:
- receive information about a repeating pattern in a signal under test, and acquisition information including a pattern length and a record length;
- determine whether to acquire a full pattern acquisition or a partial pattern acquisition based on a number of samples per pattern and the record length;
- generate an optimized trigger holdoff period based on a minimum trigger holdoff period of the test and measurement instrument and whether the acquisition is the full pattern acquisition or the partial pattern acquisition;
- and
- acquire the signal under test by acquiring a portion of the signal under test every optimized trigger holdoff period.
Dependencies are inferred from the claim text.