# US 12,014,879 B2 · Multilayer electronic component

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- Number: US 12,014,879 B2
- Document ID: US12014879B2
- Status: Granted
- Kind: B2
- Application number: 17/903,302
- Filed: 2022-09-06
- Published: 2023-03-09
- Granted: 2024-06-18
- Earliest claimed: 2021-09-08
- Assignees: TDK Corporation
- Applicants: TDK Corporation
- Inventors: Toshihiro Iguchi; Yoshitaka Nagashima; Yasuhiro Okui; Masahide Ishizuya; Yuuki Hidaka
- Web page: https://patentgrep.com/patent/US12014879B2

## CPC

- H01G 4/30: Stacked capacitors (H01G4/33 takes precedence)
- H01G 4/012: Form of non-self-supporting electrodes
- H01G 4/12: Ceramic dielectrics {(H01G4/085 takes precedence)}
- H01G: CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE (selection of specified materials as dielectric H01B3/00; capacitors having potential barriers H10D1/62, H10K10/10)

## Abstract

A multilayer electronic component includes a plurality of dielectric layers and a plurality of electrode layers that are alternately stacked. A skewness of a distribution of thicknesses of the plurality of dielectric layers at a plurality of arbitrary locations of the plurality of dielectric layers is 0.2 or more.

## Claims

### Claim 1

A multilayer electronic component, comprising:
a plurality of dielectric layers; and
a plurality of electrode layers, wherein the plurality of dielectric layers and the plurality of electrode layers are alternately stacked,
wherein a skewness of a distribution of thicknesses of the plurality of dielectric layers at a plurality of arbitrary locations of the plurality of dielectric layers is 0.2 or more.

### Claim 2 (depends on 1)

The multilayer electronic component according to claim 1,
wherein the skewness of the distribution is 0.6 or less.

### Claim 3 (depends on 1)

The multilayer electronic component according to claim 1,
wherein a kurtosis of the distribution is 3.2 or more.

### Claim 4 (depends on 3)

The multilayer electronic component according to claim 3,
wherein the kurtosis of the distribution is 5.0 or less.

### Claim 5 (depends on 1)

The multilayer electronic component according to claim 1,
wherein an average value of the thicknesses of the plurality of dielectric layers is 0.4 μm or less.